WO2017056552A1 - Contact input control device - Google Patents

Contact input control device Download PDF

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Publication number
WO2017056552A1
WO2017056552A1 PCT/JP2016/066011 JP2016066011W WO2017056552A1 WO 2017056552 A1 WO2017056552 A1 WO 2017056552A1 JP 2016066011 W JP2016066011 W JP 2016066011W WO 2017056552 A1 WO2017056552 A1 WO 2017056552A1
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WO
WIPO (PCT)
Prior art keywords
input
contact
signal
unit
inspection
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PCT/JP2016/066011
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French (fr)
Japanese (ja)
Inventor
貫造 関
Original Assignee
株式会社京三製作所
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Application filed by 株式会社京三製作所 filed Critical 株式会社京三製作所
Priority to CN201680057178.7A priority Critical patent/CN108137070B/en
Publication of WO2017056552A1 publication Critical patent/WO2017056552A1/en

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B61—RAILWAYS
    • B61L—GUIDING RAILWAY TRAFFIC; ENSURING THE SAFETY OF RAILWAY TRAFFIC
    • B61L19/00—Arrangements for interlocking between points and signals by means of a single interlocking device, e.g. central control
    • B61L19/06—Interlocking devices having electrical operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Definitions

  • the present invention relates to a contact input control device used in, for example, an electronic interlocking system for railway signal security control.
  • an input control device disclosed in Patent Document 1 is used in order to capture the operating state of field devices such as traffic lights and switchboards via a relay.
  • the object of the present invention is to solve the above-mentioned problems, determine the closed state / open state of the input contact, and if the input contact is in the closed state or in the open state, the main body has failed. It is an object of the present invention to provide a contact input control device that can correctly determine whether or not to improve reliability and reduce the size and cost.
  • a contact input control device comprises a contact input unit, an inspection voltage application unit, and a control unit, and the contact input unit connects an input contact with a positive side of an external DC power supply.
  • the inspection voltage application unit is connected to the inspection voltage input terminal of the contact input unit;
  • An inspection voltage output terminal for applying an inspection voltage to the input unit, a DC power input terminal branched from between the positive side of the DC power source and the input contact, and an inspection control answer signal to the control unit Output A second output terminal; and a second input terminal for inputting an inspection control signal from the control unit, wherein the control unit includes the contact input signal corresponding to the input control signal and the inspection control signal, and the Based on the output data of the inspection control answer signal and the input / output logic data at the time of normal operation of the open / closed state of the input contact stored in advance, the open / closed state of the contact input and the It is characterized by determining a failure.
  • the contact input control device receives the contact input signal and the inspection control answer signal after changing the H level side and the L level side of the input control signal and the inspection control signal with time. In addition to determining the closed / open state of the input contact, it is possible to determine whether or not a failure has occurred in the main body regardless of whether the input contact is open or closed. It is.
  • the reliability can be improved and the pulse transformer, which is an electromagnetic component, is not used, so that the size can be reduced and the cost can be reduced.
  • FIG. 6 is an operation time chart when the input contact is open and the phototransistor T4 of the photocoupler P4 of the inspection voltage application unit fails on the conduction side.
  • 9 is an input / output logic table of the control unit 4 in the case of FIG.
  • FIG. 1 is a block circuit configuration diagram of the contact input control device 1.
  • the contact input control device 1 includes a contact input unit 2, an inspection voltage application unit 3, and a control unit 4, and a DC power source E is connected to one side of the contact input control device 1.
  • An input contact N indicating an operation state of a ground device such as a traffic light or a switch is arranged on the plus side of the DC power source E, and an electronic interlocking device 5 as a host device is connected to the other side of the contact input control device 1.
  • a ground device such as a traffic light or a switch
  • the contact input control device 1 opens / closes information on the input contact N, that is, operation status information on ground devices such as traffic lights and switchboards. Response of failure information that has occurred. Alternatively, information on the open / closed state of the input contact N and failure information are returned to the electronic interlocking device 5 at predetermined time intervals.
  • one input contact N is connected, but a plurality of input contacts N can also be used.
  • the same number of contact input units 2 and test voltage application units 3 are required according to the number of input contacts N, and the plurality of contact input units 2 and test voltage application units 3 are controlled by one.
  • the DC power source E branches in parallel and is connected to a plurality of input contacts N.
  • the contact input unit 2 includes a contact voltage input terminal 2 a that connects the positive side of the DC power source E via the input contact N, a negative input terminal 2 b that connects the negative side of the DC power source E, and the inspection voltage application unit 3.
  • An inspection voltage input terminal 2c for inputting a detection voltage signal, an output terminal 2d for outputting a contact input signal S1 to the control unit 4, and an input terminal 2e for inputting an input control signal S2 from the control unit 4 are provided. ing.
  • the inspection voltage application unit 3 is connected to the inspection voltage input terminal 2 c of the contact input unit 2, the inspection voltage output terminal 3 a that applies the inspection voltage to the contact input unit 2, the positive side of the DC power supply E, and the input contact N
  • a DC power supply input terminal 3b that is branched and connected to the control unit 4, an output terminal 3c that outputs the inspection control answer signal S3 to the control unit 4, and an input terminal 3d that inputs the inspection control signal S4 from the control unit 4. is doing.
  • the control unit 4 has an input terminal 4a for inputting the contact input signal S1 from the output terminal 2d of the contact input unit 2, an output terminal 4b for outputting the input control signal S2 to the input terminal 2e of the contact input unit 2, and an inspection voltage application. It has an input terminal 4c for inputting the inspection control answer signal S3 from the output terminal 3c of the unit 3, and an output terminal 4d for outputting the inspection control signal S4 to the input terminal 3d of the inspection voltage application unit 3.
  • FIG. 2 is a circuit configuration diagram showing details of the contact input unit 2 and the inspection voltage application unit 3 in the block circuit of the contact input control device 1.
  • the contact input unit 2 connects in series a photocoupler P1 including a light emitting diode D1 and a phototransistor T1, and a photocoupler P2 including a light emitting diode D2 and a phototransistor T2.
  • the positive side of the DC power source E from the contact voltage input terminal 2a and the inspection voltage input terminal 2c connected to the input contact N is connected to the negative side of the DC power source E from the negative input terminal 2b via the photocouplers P1 and P2. is doing.
  • the contact voltage input terminal 2a is connected to the anode of the light emitting diode D1 of the photocoupler P1 of the contact input unit 2 via the resistor R1 and the resistor R2, and the cathode is connected to the collector of the phototransistor T2 of the photocoupler P2.
  • the emitter of the phototransistor T2 is connected to the negative input terminal 2b, and a resistor R3 is connected between the connection point between the resistors R1 and R2 and the negative input terminal 2b.
  • a diode D5 for bypassing the reverse current is connected in parallel to the light emitting diode D1 of the photocoupler P1 and the phototransistor T2 of the photocoupler P2. Furthermore, the connection point between the cathode side of the diode D5 and the resistor R2 is connected to the inspection voltage input terminal 2c.
  • the collector of the phototransistor T1 of the photocoupler P1 is connected to the output terminal 2d via the inverting element IC1, and a power supply voltage e of, for example, 5 V is connected between the collector of the phototransistor T1 and the inverting element IC1 via the resistor R4. Applied.
  • the emitter of the phototransistor T1 is connected to 0V.
  • a power supply voltage e of 5 V is applied to the anode of the light emitting diode D2 of the photocoupler P2 via the resistor R5, and the cathode of the light emitting diode D2 is connected to the input terminal 2e via the inverting element IC2.
  • the inspection voltage application unit 3 is connected in series with a photocoupler P3 including a light emitting diode D3 and a phototransistor T3, and a photocoupler P4 including a light emitting diode D4 and a phototransistor T4.
  • a DC power supply input terminal 3b branched from an external DC power supply E is connected to an inspection voltage output terminal 3a via photocouplers P3 and P4.
  • the inspection voltage output terminal 3a is connected to the cathode of the light emitting diode D3 of the photocoupler P3 via the resistor R6, and the emitter of the phototransistor T4 of the photocoupler P4 is connected to the anode.
  • the collector of the phototransistor T4 is connected to the DC power supply input terminal 3b, and a diode for bypassing the reverse current connected in parallel to the light emitting diode D3 of the photocoupler P3 and the phototransistor T4 of the photocoupler P4. D6 is connected.
  • the collector of the phototransistor T3 of the photocoupler P3 is connected to the output terminal 3c via the inverting element IC3, and a power supply voltage e of, for example, 5V is connected between the collector of the phototransistor T3 and the inverting element IC3 via the resistor R7. Applied.
  • the emitter of the phototransistor T3 is connected to 0V.
  • a power supply voltage e of 5 V is applied to the anode of the light emitting diode D4 of the photocoupler P4 via the resistor R8, and the cathode of the light emitting diode D4 is connected to the input terminal 3d via the inverting element IC4.
  • FIG. 3 shows an operation time chart when the input contact N is in an open state, that is, when the input contact N is in an OFF state, and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation. Is a closed state, that is, the input contact N is in an ON state, and the contact input unit 2 and the inspection voltage application unit 3 are operating time charts during normal operation.
  • t1, t3, t5, t7, and t9 indicate the output timing of the control unit 4
  • t2, t4, t6, t8, and t10 are The input timing of the control unit 4 is shown.
  • Reference numerals s1 to s5 denote steps of contact input processing of the control unit 4, and d in the figure denotes an operation delay of the circuit.
  • control unit 4 stores the contact input signal S1 and the inspection control answer signal S3, which are input at the input timings t2, t4, t6, t8, and t10, and the H level / L level input data, and FIGS.
  • the open / closed state of the input contact N and the failure of the main body can be determined by comparing the input / output logic during normal operation shown in FIG.
  • FIG. 3 shows an operation timing chart when the input contact N is in an open open state and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation.
  • control unit 4 outputs both the input control signal S2 of the contact input unit 2 and the inspection control signal S4 of the inspection voltage application unit 3 as L level output data.
  • the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
  • the inverting elements IC2 and IC4 Invert the output to the H level signal. At this time, since no current flows from each power supply voltage e to the contact input unit 2 and the inspection voltage application unit 3, the photocouplers P2 and P4 remain off.
  • the L level signal of the contact input signal S1 and the inspection control answer signal S3 is used as the control unit 4. Will be output.
  • control unit 4 outputs only the input control signal S2 from the L level signal to the H level signal to the input terminal 2e of the contact input unit 2, and then checks the contact input signal S1 at the input timing t4.
  • the control answer signal S3 is read and used as input data.
  • the inverting element IC2 When the control unit 4 outputs an H level signal using only the input control signal S2 as output data and inputs this H level signal to the input terminal 2e of the contact input unit 2, the inverting element IC2 outputs the output of the H level signal to the L level signal. Invert. By making the output of the inverting element IC2 an L level signal, a current flows from the power supply voltage e and the light emitting diode D2 emits light.
  • the control unit 4 outputs output data in which the input control signal S2 and the inspection control signal S4 are H level signals to the contact input unit 2 and the inspection voltage application unit 3. Thereafter, the control unit 4 reads the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 at the input timing t6 and uses them as input data.
  • the control unit 4 outputs an H level signal using the inspection control signal S4 as output data.
  • the inverting element IC4 When the H level signal is input to the input terminal 3d of the inspection voltage application unit 3, the inverting element IC4 outputs the output of the H level signal to the L level signal. Invert. By making the output of the inverting element IC4 an L level signal, a current flows from the power supply voltage e and the light emitting diode D4 emits light.
  • the inspection voltage application unit 3 receives the H level signal of the inspection control signal S4, the photocouplers P3 and P4 are also turned on, and a current is supplied from the inspection voltage input terminal 2c to the contact input unit 2. Flows in.
  • the light emitting diode D2 When the H level signal of the input control signal S2 is output from the control unit 4 to the contact input unit 2, the light emitting diode D2 emits light as described above. When the light emitting diode D2 emits light, a current flows from the inspection voltage applying unit 3 to the phototransistor T2, and the light emitting diode D1 of the photocoupler P1 connected in series emits light.
  • the light emitting diode D1 of the photocoupler P1 emits light
  • a current flows through the phototransistor T1
  • the inverting element IC1 is inverted from the L level signal to the H level signal. Therefore, at the input timing t6, the H level signal of the contact input signal S1 and the H level signal of the inspection control answer signal S3 are controlled as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3. To be output to the unit 4.
  • the control unit 4 sets the input control signal S2 as an H level signal, and outputs output data in which the inspection control signal S4 is switched from the H level signal to the L level signal.
  • the inspection control signal S4 is switched to the L level signal and output, the photocouplers P3 and P4 are turned off, and the current flowing from the inspection voltage input terminal 2c to the contact input unit 2 is stopped.
  • the photocouplers P3 and P4 are also turned off, so that the current flowing through the photocouplers P1 and P2 is also stopped. Then, the output of the H level signal of the contact input signal S1 is switched to the L level signal with a delay of d from the output timing t7.
  • the contact input signal S1 and the L level signal of the inspection control answer signal S3 are output to the control unit 4. It will be.
  • the control unit 4 returns the input control signal S2 from the H level signal to the L level signal to the contact input unit 2, and outputs the output data using the inspection control signal S4 as the L level signal.
  • the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
  • FIG. 4 shows an operation timing chart when the input contact N is closed and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation. Since the input contact N is on, current always flows from the contact voltage input terminal 2a.
  • the control unit 4 outputs both the input control signal S2 to the contact input unit 2 and the inspection control signal S4 to the inspection voltage application unit 3 as output data that is an L level signal. Then, at the input timing t2, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the L level signal of the contact input signal S1 and the inspection control answer signal S3 is sent to the control unit 4. Will be output.
  • control unit 4 outputs only the input control signal S2 from the L level signal to the H level signal and outputs it to the input terminal 2e of the contact input unit 2, and then at the input timing t4, the contact input signal S1 and The inspection control answer signal S3 is read and used as input data.
  • the control unit 4 outputs only the input control signal S2 as an H level signal.
  • this H level signal is input to the input terminal 2e of the contact input unit 2, the inverting element IC2 is inverted to an L level signal.
  • a current flows from the power supply voltage e and the light emitting diode D2 emits light.
  • the inspection control signal S4 from the control unit 4 continues to be an L level signal and is output to the input terminal 3d of the inspection voltage application unit 3, the phototransistors T3 and T4 remain off, and the inspection control answer signal In S3, the output of the L level signal is continued. Therefore, at the input timing t4, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the H level signal of the contact input signal S1 and the L level of the inspection control answer signal S3 are used. The signal is output to the control unit 4.
  • control unit 4 outputs output data in which the input control signal S2 to the contact input unit 2 and the inspection control signal S4 to the inspection voltage application unit 3 are H level signals. Thereafter, at the input timing t6, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
  • the contact input signal S1 continues to output the H level signal as described above.
  • the inverting element IC4 inverts the H level signal to the L level signal, and the phototransistor T3 and the phototransistor T4 are turned on. .
  • the inverting element IC3 Inverts the L level signal to the H level signal, and delays the H level signal of the inspection control answer signal S3 from the output terminal 3c by d from the output timing t5. 4 will be output. Therefore, the contact input signal S1 and the H level signal of the inspection control answer signal S3 are output to the control unit 4 as output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3 at the input timing t6. To do.
  • the control unit 4 sets the input control signal S2 as an H level signal, and outputs output data in which the inspection control signal S4 is switched from the H level signal to the L level signal. Thereafter, at the input timing t8, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
  • step s4 when the inspection control signal S4 is switched to the L level signal and output, the photocouplers P3 and P4 are turned off. However, since the input contact N is in the closed state, a current flows to the photocouplers P1 and P2 via the contact voltage input terminal 2a in response to the continuous input of the H level signal of the input control signal S2. The state will be maintained.
  • the contact input signal S1 is an H level signal and the inspection control answer signal S3 is an L level.
  • the signal is output to the control unit 4.
  • control unit 4 outputs output data obtained by returning the output of the H level signal of the inspection control signal S4 to the L level signal to the inspection voltage applying unit 3. Thereafter, at the input timing t10, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
  • the controller 4 switches the H level signal of the input control signal S2 to the L level signal at the output timing t9, and outputs the L level signal of the inspection control signal S4, similarly to the output at the output timing t1 of step s1.
  • the photocouplers P1 and P2 are turned off, and the H level signal of the contact input signal S1 is set to L with a delay of d from the output timing t9. Switch to level signal and output. Therefore, at the input timing t10, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the test voltage application unit 3, the L level signal of the contact input signal S1 and the test control answer signal S3 is sent to the control unit 4. Will be output.
  • Input timings t2, t4, t6, and output timings t2, t3, t5, t7 and t9 from the control unit 4 are input timing signals t2, t4, t6,
  • the H level / L level input data of the contact input signal S1 and the inspection control answer signal S3 at t8 and t10 are compared with the input / output logic during the normal operation in the open / closed state shown in FIGS. Thus, it can be determined whether the input contact N is in an open open state or in an on closed state, or whether the contact input control device 1 is in failure.
  • FIG. 7 is a flowchart for determining the open / closed state of the input contact N and the failure state of the contact input control device 1.
  • Input data of S1 and inspection control answer signal S3 are collected.
  • these input data and the input data in the open state in FIG. 5 are compared, and if they match, it is determined that the input contact N is in the open state.
  • the flow proceeds to flow f3 and is compared with the input data in the closed state in FIG. If they match, it is determined that the input contact N is in a closed state, and if it does not match, it is determined that the contact input control device 1 is in failure.
  • FIG. 8 is an operation time chart when the contact input control device 1 is in a failure state, for example, when the input transistor N is in an open open state and the phototransistor T4 of the photocoupler P4 of the inspection voltage application unit 3 fails on the conduction side.
  • FIG. 9 shows an input / output logic table at the time of this failure.
  • the inspection control answer signal S3 is output as an H level signal regardless of the level input signal.
  • the portion surrounded by a circle is a portion that does not match any of the output logic tables in FIGS. 5 and 6, and therefore, it is determined as a mismatch error in the flow f3 in FIG. It is determined that this has occurred.
  • the inspection voltage application unit 3 since a mismatch is found in the inspection control answer signal S3, it can be seen that the inspection voltage application unit 3 has failed. Similar to the inspection voltage application unit 3, the contact input unit 2 including a pair of photocouplers P1 and P2 may have a failure as shown in FIGS. In this case, the contact input signal S1 is inconsistent with the output logic tables of FIGS. 5 and 6, so that it can be determined that the contact input unit 2 has failed.
  • the process of FIG. 7 is executed at predetermined time intervals, and the mismatch continues for a predetermined number of times. In such a case, it may be determined that a failure has occurred in the main body.
  • the circuit size can be reduced by adopting a pair of photocouplers P3 and P4 in the same manner as the contact input unit 2 in place of the pulse transformer for the inspection voltage application unit 3 having the conventional pulse transformer. It becomes possible to reduce the cost.
  • control part 4 by obtaining the input signal of the inspection control answer signal S3 from the inspection voltage application part 3, either the contact input part 2 or the inspection voltage application part 3 in the contact input control device 1 is abnormal. Can be easily determined.

Abstract

A contact input control device 1 is configured from a contact input unit 2, a test voltage application unit 3, and a control unit 4. A DC power source E is connected to one side of the contact input control device 1, an input contact N that shows the operating status of an aboveground device such as a signaler or switcher is disposed on the positive side of the DC power source E, and an electronic coupling device is connected to the other side. The control unit 4 compares input data of the H level/L level of a contact input signal S1 and a test control answer signal S3 relative to output data of the H level/L level of an input control signal S2 and a test control signal S4, and input/output logic during normal operation of an opened status/closed status, whereby the control unit 4 can determine whether or not the input contact N is in the opened status of being off or the closed status of being on, or whether or not the contact input control device 1 is malfunctioning.

Description

接点入力制御装置Contact input control device
　本発明は、例えば鉄道信号保安制御用の電子連動システムなどで使用する接点入力制御装置に関するものである。 The present invention relates to a contact input control device used in, for example, an electronic interlocking system for railway signal security control.
　鉄道の分野では、列車を安全かつ効率的に運行するため、信号機や転てつ機などの相互間で、その取り扱いについて一定の順序と制限を設ける電子連動装置が使用されている。この電子連動装置に対して、信号機や転てつ機などの現場機器の動作状態をリレーを介して取り込むために、特許文献１に開示する入力制御装置が使用されている。 In the field of railways, in order to operate trains safely and efficiently, electronic interlocking devices are used that provide a certain order and restrictions on the handling of traffic lights and switchboards. For this electronic interlocking device, an input control device disclosed in Patent Document 1 is used in order to capture the operating state of field devices such as traffic lights and switchboards via a relay.
　特許文献１の入力制御装置では、入力接点が開放状態（オフ）の場合と閉成状態（オン）の場合の何れであっても、接点信号入力部又は故障検査部に故障が生じているか否かを検出することが可能である。 In the input control device of Patent Document 1, whether or not a failure has occurred in the contact signal input unit or the failure inspection unit, regardless of whether the input contact is in an open state (off) or a closed state (on). Can be detected.
特開２０１１－５１５３９号公報JP 2011-51539 A
　しかし、特許文献１の入力制御装置においては、電磁部品としてパルストランスを使用するため、回路の小形化、コストの低減化等が困難であるという問題がある。また、制御論理部においては２種の出力信号に対して、応答信号が接点入力信号のみであるため、接点信号入力部又は故障検査部の何れに故障が発生したのかを判断することが難しい場合がある。 However, in the input control device of Patent Document 1, since a pulse transformer is used as an electromagnetic component, there is a problem that it is difficult to reduce the size of the circuit and reduce the cost. In addition, when the control logic section has only a contact input signal as the response signal for the two types of output signals, it is difficult to determine whether a failure has occurred in the contact signal input section or the fault inspection section. There is.
　本発明の目的は、上述の課題を解決し、入力接点の閉成状態／開放状態を判定すると共に、入力接点が閉成状態の場合と開放状態の場合の何れでも、本体に故障が生じているか否かを正しく判定して、信頼性の向上を図ると共に、小形化とコストの低減化を可能とする接点入力制御装置を提供することにある。 The object of the present invention is to solve the above-mentioned problems, determine the closed state / open state of the input contact, and if the input contact is in the closed state or in the open state, the main body has failed. It is an object of the present invention to provide a contact input control device that can correctly determine whether or not to improve reliability and reduce the size and cost.
　上記目的を達成するための本発明に係る接点入力制御装置は、接点入力部と検査電圧印加部と制御部とから構成され、前記接点入力部は、外部の直流電源のプラス側と入力接点を介して接続した接点電圧入力端子と、前記直流電源のマイナス側と接続したマイナス入力端子と、前記検査電圧印加部と接続した検査電圧入力端子と、前記制御部に対して接点入力信号を出力する第１の出力端子と、前記制御部から入力制御信号を入力する第１の入力端子とを有し、前記検査電圧印加部は、前記接点入力部の前記検査電圧入力端子と接続し、前記接点入力部に対して検査電圧を印加する検査電圧出力端子と、前記直流電源のプラス側と前記入力接点との間から分岐接続した直流電源入力端子と、前記制御部に対して検査制御アンサ信号を出力する第２の出力端子と、前記制御部から検査制御信号を入力する第２の入力端子とを有し、前記制御部は、前記入力制御信号及び前記検査制御信号に応じた前記接点入力信号及び前記検査制御アンサ信号の出力データと、予め記憶した前記入力接点の開放状態／閉成状態の正常動作時の入出力論理データとに基づいて、前記接点入力の開放状態／閉成状態及び本体内の故障を判定することを特徴とする。 In order to achieve the above object, a contact input control device according to the present invention comprises a contact input unit, an inspection voltage application unit, and a control unit, and the contact input unit connects an input contact with a positive side of an external DC power supply. A contact voltage input terminal connected to the negative power source, a negative input terminal connected to the negative side of the DC power supply, a test voltage input terminal connected to the test voltage application unit, and a contact input signal to the control unit. A first output terminal and a first input terminal for inputting an input control signal from the control unit; the inspection voltage application unit is connected to the inspection voltage input terminal of the contact input unit; An inspection voltage output terminal for applying an inspection voltage to the input unit, a DC power input terminal branched from between the positive side of the DC power source and the input contact, and an inspection control answer signal to the control unit Output A second output terminal; and a second input terminal for inputting an inspection control signal from the control unit, wherein the control unit includes the contact input signal corresponding to the input control signal and the inspection control signal, and the Based on the output data of the inspection control answer signal and the input / output logic data at the time of normal operation of the open / closed state of the input contact stored in advance, the open / closed state of the contact input and the It is characterized by determining a failure.
　本発明に係る接点入力制御装置によれば、入力制御信号と検査制御信号のＨレベル側とＬレベル側とを経時的に変化させた後に、接点入力信号と検査制御アンサ信号を受信することにより、入力接点の閉成状態／開放状態を判定すると共に、入力接点が開放状態、閉成状態の場合の何れの場合であっても、本体に故障が生じているか否かを判定することが可能である。 The contact input control device according to the present invention receives the contact input signal and the inspection control answer signal after changing the H level side and the L level side of the input control signal and the inspection control signal with time. In addition to determining the closed / open state of the input contact, it is possible to determine whether or not a failure has occurred in the main body regardless of whether the input contact is open or closed. It is.
　従って、信頼性を高めることができると共に、電磁部品であるパルストランスを使用しないため、小形化とコストの低減化が図ることができる。 Therefore, the reliability can be improved and the pulse transformer, which is an electromagnetic component, is not used, so that the size can be reduced and the cost can be reduced.
接点入力制御装置のブロック回路構成図である。It is a block circuit block diagram of a contact input control device. 接点入力部、検査電圧印加部の回路構成図である。It is a circuit block diagram of a contact input part and a test voltage application part. 入力接点が開放状態で、正常動作時の動作タイムチャート図である。It is an operation time chart figure at the time of a normal operation in the state where an input contact is open. 入力接点が閉成状態で、正常動作時の動作タイムチャート図である。It is an operation time chart figure at the time of normal operation in the state where an input contact is closed. 入力接点が開放状態の入出力論理表である。It is an input / output logic table with input contacts open. 入力接点が閉成状態の入出力論理表である。It is an input / output logic table with the input contact closed. 入力接点の開放状態／閉成状態及び接点入力制御装置の故障状態の判定を行うフローチャート図である。It is a flowchart figure which performs the determination of the open state / closed state of an input contact, and the failure state of a contact input control apparatus. 入力接点が開放状態で、検査電圧印加部のフォトカプラＰ４のフォトトランジスタＴ４が導通側に故障した場合の動作タイムチャート図である。FIG. 6 is an operation time chart when the input contact is open and the phototransistor T4 of the photocoupler P4 of the inspection voltage application unit fails on the conduction side. 図８の場合における制御部４の入出力論理表である。9 is an input / output logic table of the control unit 4 in the case of FIG.
　本発明を図示の実施例に基づいて詳細に説明する。
  図１は接点入力制御装置１のブロック回路構成図である。接点入力制御装置１は、接点入力部２と検査電圧印加部３と制御部４とから構成され、接点入力制御装置１の一方側に直流電源Ｅが接続されている。この直流電源Ｅのプラス側に信号機や転てつ機等の地上装置の動作状態を示す入力接点Ｎを配置し、接点入力制御装置１の他方側に上位装置である例えば電子連動装置５が接続されている。 The present invention will be described in detail based on the embodiments shown in the drawings.
FIG. 1 is a block circuit configuration diagram of the contact input control device 1. The contact input control device 1 includes a contact input unit 2, an inspection voltage application unit 3, and a control unit 4, and a DC power source E is connected to one side of the contact input control device 1. An input contact N indicating an operation state of a ground device such as a traffic light or a switch is arranged on the plus side of the DC power source E, and an electronic interlocking device 5 as a host device is connected to the other side of the contact input control device 1. Has been.
　電子連動装置５からのポーリング等による状態情報要求に応じて、接点入力制御装置１は入力接点Ｎの開放状態／閉成状態の情報、つまり信号機や転てつ機等の地上装置の動作状態情報や発生した故障情報を応答する。或いは、所定時間間隔毎に、電子連動装置５に対して入力接点Ｎの開放状態／閉成状態の情報、故障情報を応答する。 In response to a status information request from the electronic interlocking device 5 such as polling, the contact input control device 1 opens / closes information on the input contact N, that is, operation status information on ground devices such as traffic lights and switchboards. Response of failure information that has occurred. Alternatively, information on the open / closed state of the input contact N and failure information are returned to the electronic interlocking device 5 at predetermined time intervals.
　なお本実施例では、１個の入力接点Ｎを接続した状態であるが、複数個の入力接点Ｎを使用することも可能である。この場合には、入力接点Ｎの個数に応じて、同数の接点入力部２及び検査電圧印加部３が必要となり、これらの複数個の接点入力部２及び検査電圧印加部３を１個の制御部４に接続する。また、電源に関しては、直流電源Ｅから並列に分岐して、複数個の入力接点Ｎに接続することになる。 In this embodiment, one input contact N is connected, but a plurality of input contacts N can also be used. In this case, the same number of contact input units 2 and test voltage application units 3 are required according to the number of input contacts N, and the plurality of contact input units 2 and test voltage application units 3 are controlled by one. Connect to part 4. As for the power source, the DC power source E branches in parallel and is connected to a plurality of input contacts N.
　接点入力部２は、直流電源Ｅのプラス側を、入力接点Ｎを介して接続する接点電圧入力端子２ａと、直流電源Ｅのマイナス側を接続するマイナス入力端子２ｂと、検査電圧印加部３から検出電圧信号を入力する検査電圧入力端子２ｃと、制御部４に対して接点入力信号Ｓ１を出力する出力端子２ｄと、制御部４からの入力制御信号Ｓ２を入力する入力端子２ｅとを有している。 The contact input unit 2 includes a contact voltage input terminal 2 a that connects the positive side of the DC power source E via the input contact N, a negative input terminal 2 b that connects the negative side of the DC power source E, and the inspection voltage application unit 3. An inspection voltage input terminal 2c for inputting a detection voltage signal, an output terminal 2d for outputting a contact input signal S1 to the control unit 4, and an input terminal 2e for inputting an input control signal S2 from the control unit 4 are provided. ing.
　検査電圧印加部３は、接点入力部２の検査電圧入力端子２ｃと接続し、接点入力部２に対して検査電圧を印加する検査電圧出力端子３ａと、直流電源Ｅのプラス側と入力接点Ｎとの間から分岐接続した直流電源入力端子３ｂと、制御部４に対して検査制御アンサ信号Ｓ３を出力する出力端子３ｃと、制御部４から検査制御信号Ｓ４を入力する入力端子３ｄとを有している。 The inspection voltage application unit 3 is connected to the inspection voltage input terminal 2 c of the contact input unit 2, the inspection voltage output terminal 3 a that applies the inspection voltage to the contact input unit 2, the positive side of the DC power supply E, and the input contact N A DC power supply input terminal 3b that is branched and connected to the control unit 4, an output terminal 3c that outputs the inspection control answer signal S3 to the control unit 4, and an input terminal 3d that inputs the inspection control signal S4 from the control unit 4. is doing.
　制御部４は接点入力部２の出力端子２ｄからの接点入力信号Ｓ１を入力する入力端子４ａと、接点入力部２の入力端子２ｅに入力制御信号Ｓ２を出力する出力端子４ｂと、検査電圧印加部３の出力端子３ｃから検査制御アンサ信号Ｓ３を入力する入力端子４ｃと、検査電圧印加部３の入力端子３ｄに検査制御信号Ｓ４を出力する出力端子４ｄとを有している。 The control unit 4 has an input terminal 4a for inputting the contact input signal S1 from the output terminal 2d of the contact input unit 2, an output terminal 4b for outputting the input control signal S2 to the input terminal 2e of the contact input unit 2, and an inspection voltage application. It has an input terminal 4c for inputting the inspection control answer signal S3 from the output terminal 3c of the unit 3, and an output terminal 4d for outputting the inspection control signal S4 to the input terminal 3d of the inspection voltage application unit 3.
　図２は接点入力制御装置１のブロック回路内の接点入力部２及び検査電圧印加部３の詳細を示す回路構成図である。接点入力部２は、発光ダイオードＤ１及びフォトトランジスタＴ１を備えるフォトカプラＰ１と、発光ダイオードＤ２及びフォトトランジスタＴ２を備えるフォトカプラＰ２とを直列に接続している。入力接点Ｎと接続した接点電圧入力端子２ａ及び検査電圧入力端子２ｃからの直流電源Ｅのプラス側は、フォトカプラＰ１及びＰ２を介して、マイナス入力端子２ｂからの直流電源Ｅのマイナス側と接続している。 FIG. 2 is a circuit configuration diagram showing details of the contact input unit 2 and the inspection voltage application unit 3 in the block circuit of the contact input control device 1. The contact input unit 2 connects in series a photocoupler P1 including a light emitting diode D1 and a phototransistor T1, and a photocoupler P2 including a light emitting diode D2 and a phototransistor T2. The positive side of the DC power source E from the contact voltage input terminal 2a and the inspection voltage input terminal 2c connected to the input contact N is connected to the negative side of the DC power source E from the negative input terminal 2b via the photocouplers P1 and P2. is doing.
　接点電圧入力端子２ａは抵抗Ｒ１及び抵抗Ｒ２を介して、接点入力部２のフォトカプラＰ１の発光ダイオードＤ１のアノードに接続し、カソードをフォトカプラＰ２のフォトトランジスタＴ２のコレクタに接続している。このフォトトランジスタＴ２のエミッタは、マイナス入力端子２ｂに接続されており、抵抗Ｒ１と抵抗Ｒ２間の接続点とマイナス入力端子２ｂとの間には、抵抗Ｒ３が接続されている。 The contact voltage input terminal 2a is connected to the anode of the light emitting diode D1 of the photocoupler P1 of the contact input unit 2 via the resistor R1 and the resistor R2, and the cathode is connected to the collector of the phototransistor T2 of the photocoupler P2. The emitter of the phototransistor T2 is connected to the negative input terminal 2b, and a resistor R3 is connected between the connection point between the resistors R1 and R2 and the negative input terminal 2b.
　また、フォトカプラＰ１の発光ダイオードＤ１及びフォトカプラＰ２のフォトトランジスタＴ２に対して、並列に逆方向電流をバイパスさせるためのダイオードＤ５が接続されている。更に、ダイオードＤ５のカソード側と抵抗Ｒ２との間の接続点は検査電圧入力端子２ｃに接続されている。 Also, a diode D5 for bypassing the reverse current is connected in parallel to the light emitting diode D1 of the photocoupler P1 and the phototransistor T2 of the photocoupler P2. Furthermore, the connection point between the cathode side of the diode D5 and the resistor R2 is connected to the inspection voltage input terminal 2c.
　フォトカプラＰ１のフォトトランジスタＴ１のコレクタは、反転素子ＩＣ１を介して出力端子２ｄに接続されており、フォトトランジスタＴ１のコレクタと反転素子ＩＣ１間に抵抗Ｒ４を介して、例えば５Ｖの電源電圧ｅが印加されている。また、フォトトランジスタＴ１のエミッタは、０Ｖに接続されている。 The collector of the phototransistor T1 of the photocoupler P1 is connected to the output terminal 2d via the inverting element IC1, and a power supply voltage e of, for example, 5 V is connected between the collector of the phototransistor T1 and the inverting element IC1 via the resistor R4. Applied. The emitter of the phototransistor T1 is connected to 0V.
　フォトカプラＰ２の発光ダイオードＤ２のアノードには抵抗Ｒ５を介して、例えば５Ｖの電源電圧ｅが印加されており、発光ダイオードＤ２のカソードは反転素子ＩＣ２を介して入力端子２ｅに接続されている。 For example, a power supply voltage e of 5 V is applied to the anode of the light emitting diode D2 of the photocoupler P2 via the resistor R5, and the cathode of the light emitting diode D2 is connected to the input terminal 2e via the inverting element IC2.
　検査電圧印加部３は、発光ダイオードＤ３及びフォトトランジスタＴ３を備えるフォトカプラＰ３と、発光ダイオードＤ４及びフォトトランジスタＴ４を備えるフォトカプラＰ４とを直列に接続している。外部の直流電源Ｅから分岐接続した直流電源入力端子３ｂは、フォトカプラＰ３及びＰ４を介して、検査電圧出力端子３ａと接続している。 The inspection voltage application unit 3 is connected in series with a photocoupler P3 including a light emitting diode D3 and a phototransistor T3, and a photocoupler P4 including a light emitting diode D4 and a phototransistor T4. A DC power supply input terminal 3b branched from an external DC power supply E is connected to an inspection voltage output terminal 3a via photocouplers P3 and P4.
　フォトカプラＰ３の発光ダイオードＤ３のカソードに検査電圧出力端子３ａが抵抗Ｒ６を介して接続し、アノードにフォトカプラＰ４のフォトトランジスタＴ４のエミッタが接続されている。 The inspection voltage output terminal 3a is connected to the cathode of the light emitting diode D3 of the photocoupler P3 via the resistor R6, and the emitter of the phototransistor T4 of the photocoupler P4 is connected to the anode.
　このフォトトランジスタＴ４のコレクタは、直流電源入力端子３ｂに接続されており、フォトカプラＰ３の発光ダイオードＤ３及びフォトカプラＰ４のフォトトランジスタＴ４に対して、並列接続した逆方向電流をバイパスさせるためのダイオードＤ６が接続されている。 The collector of the phototransistor T4 is connected to the DC power supply input terminal 3b, and a diode for bypassing the reverse current connected in parallel to the light emitting diode D3 of the photocoupler P3 and the phototransistor T4 of the photocoupler P4. D6 is connected.
　フォトカプラＰ３のフォトトランジスタＴ３のコレクタは、反転素子ＩＣ３を介して出力端子３ｃに接続されており、フォトトランジスタＴ３のコレクタと反転素子ＩＣ３間に抵抗Ｒ７を介して、例えば５Ｖの電源電圧ｅが印加されている。また、フォトトランジスタＴ３のエミッタは、０Ｖに接続されている。 The collector of the phototransistor T3 of the photocoupler P3 is connected to the output terminal 3c via the inverting element IC3, and a power supply voltage e of, for example, 5V is connected between the collector of the phototransistor T3 and the inverting element IC3 via the resistor R7. Applied. The emitter of the phototransistor T3 is connected to 0V.
　フォトカプラＰ４の発光ダイオードＤ４のアノードには抵抗Ｒ８を介して、例えば５Ｖの電源電圧ｅが印加されており、発光ダイオードＤ４のカソードは反転素子ＩＣ４を介して入力端子３ｄに接続されている。 For example, a power supply voltage e of 5 V is applied to the anode of the light emitting diode D4 of the photocoupler P4 via the resistor R8, and the cathode of the light emitting diode D4 is connected to the input terminal 3d via the inverting element IC4.
　図３は入力接点Ｎが開放状態つまり入力接点Ｎがオフ状態であって、接点入力部２及び検査電圧印加部３が正常動作時の動作タイムチャート図を示しており、図４は入力接点Ｎが閉成状態つまり入力接点Ｎがオン状態であり、接点入力部２及び検査電圧印加部３が正常動作時の動作タイムチャート図を示している。 FIG. 3 shows an operation time chart when the input contact N is in an open state, that is, when the input contact N is in an OFF state, and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation. Is a closed state, that is, the input contact N is in an ON state, and the contact input unit 2 and the inspection voltage application unit 3 are operating time charts during normal operation.
　これらの時間軸を横軸とした図３、図４の動作タイムチャート図において、ｔ１、ｔ３、ｔ５、ｔ７、ｔ９は制御部４の出力タイミングを示し、ｔ２、ｔ４、ｔ６、ｔ８、ｔ１０は制御部４の入力タイミングを示している。ｓ１～ｓ５は制御部４の接点入力処理の各ステップを表しており、図中のｄは回路の動作遅延を示している。 3 and 4 with these time axes as horizontal axes, t1, t3, t5, t7, and t9 indicate the output timing of the control unit 4, and t2, t4, t6, t8, and t10 are The input timing of the control unit 4 is shown. Reference numerals s1 to s5 denote steps of contact input processing of the control unit 4, and d in the figure denotes an operation delay of the circuit.
　図３、図４における制御部４からの出力タイミングｔ１、ｔ３、ｔ５、ｔ７、ｔ９で行う入力制御信号Ｓ２及び検査制御信号Ｓ４のＨ（Ｈｉｇｈ)レベル／Ｌ（Ｌｏｗ)レベルの出力処理は予め設定されており、各出力タイミングに応じて設定された入力制御信号Ｓ２及び検査制御信号Ｓ４から成る出力データを出力する。 The output processing of the H (High) level / L (Low) level of the input control signal S2 and the inspection control signal S4 performed at the output timings t1, t3, t5, t7, and t9 from the control unit 4 in FIGS. Output data consisting of the input control signal S2 and the inspection control signal S4 set according to each output timing is output.
　そして、制御部４は入力タイミングｔ２、ｔ４、ｔ６、ｔ８、ｔ１０で入力される接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３のＨレベル／Ｌレベルの入力データと、予め記憶した図５、図６に示す正常動作時の入出力論理とを比較することで、入力接点Ｎの開放状態／閉成状態及び本体の故障を判定することができる。 Then, the control unit 4 stores the contact input signal S1 and the inspection control answer signal S3, which are input at the input timings t2, t4, t6, t8, and t10, and the H level / L level input data, and FIGS. The open / closed state of the input contact N and the failure of the main body can be determined by comparing the input / output logic during normal operation shown in FIG.
　図３は入力接点Ｎがオフの開放状態で、接点入力部２及び検査電圧印加部３が正常動作時の動作タイミングチャート図を示している。 FIG. 3 shows an operation timing chart when the input contact N is in an open open state and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation.
　ステップｓ１の出力タイミングｔ１において、制御部４は接点入力部２の入力制御信号Ｓ２及び検査電圧印加部３の検査制御信号Ｓ４を何れもＬレベルの出力データとして出力する。そして、入力タイミングｔ２で接点入力部２からの接点入力信号Ｓ１と検査電圧印加部３からの検査制御アンサ信号Ｓ３とを読み込んで入力データとする。 At the output timing t1 of step s1, the control unit 4 outputs both the input control signal S2 of the contact input unit 2 and the inspection control signal S4 of the inspection voltage application unit 3 as L level output data. At the input timing t2, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
　制御部４の出力データとしてＬレベル信号を、接点入力部２の入力端子２ｅ及び検査電圧印加部３の入力端子３ｄに入力すると、反転素子ＩＣ２及びＩＣ４は出力をＨレベル信号に反転する。このとき、接点入力部２及び検査電圧印加部３には、各電源電圧ｅから電流が流れないので、フォトカプラＰ２及びＰ４はオフの状態のままである。 When the L level signal is input as the output data of the control unit 4 to the input terminal 2e of the contact input unit 2 and the input terminal 3d of the inspection voltage application unit 3, the inverting elements IC2 and IC4 invert the output to the H level signal. At this time, since no current flows from each power supply voltage e to the contact input unit 2 and the inspection voltage application unit 3, the photocouplers P2 and P4 remain off.
　フォトカプラＰ２及びＰ４がオフの状態の場合は、フォトトランジスタＴ２及びＴ４に電流が流れることがないため、発光ダイオードＤ１及びＤ３が発光することはなく、フォトカプラＰ１及びＰ３はオフのままである。 When the photocouplers P2 and P4 are in an off state, no current flows through the phototransistors T2 and T4, so that the light emitting diodes D1 and D3 do not emit light, and the photocouplers P1 and P3 remain off. .
　従って、入力タイミングｔ２においては、接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３のＬレベル信号を制御部４に出力することになる。 Accordingly, at the input timing t2, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the L level signal of the contact input signal S1 and the inspection control answer signal S3 is used as the control unit 4. Will be output.
　ステップｓ２の出力タイミングｔ３において、制御部４は接点入力部２の入力端子２ｅに入力制御信号Ｓ２のみをＬレベル信号からＨレベル信号として出力した後に、入力タイミングｔ４で接点入力信号Ｓ１との検査制御アンサ信号Ｓ３を読み込んで入力データとする。 At the output timing t3 of step s2, the control unit 4 outputs only the input control signal S2 from the L level signal to the H level signal to the input terminal 2e of the contact input unit 2, and then checks the contact input signal S1 at the input timing t4. The control answer signal S3 is read and used as input data.
　制御部４は入力制御信号Ｓ２のみを出力データとしてＨレベル信号を出力し、このＨレベル信号を接点入力部２の入力端子２ｅに入力すると、反転素子ＩＣ２はＨレベル信号の出力をＬレベル信号に反転する。反転素子ＩＣ２の出力をＬレベル信号にすることで、電源電圧ｅから電流が流れ発光ダイオードＤ２が発光する。 When the control unit 4 outputs an H level signal using only the input control signal S2 as output data and inputs this H level signal to the input terminal 2e of the contact input unit 2, the inverting element IC2 outputs the output of the H level signal to the L level signal. Invert. By making the output of the inverting element IC2 an L level signal, a current flows from the power supply voltage e and the light emitting diode D2 emits light.
　しかし、入力接点Ｎがオフ状態であると共に、フォトカプラＰ３及びＰ４もオフ状態であるため、フォトカプラＰ２のフォトトランジスタＴ２に電流が流れることはない。従って、出力タイミングｔ３において、接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データは反転することがなく、接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３として、Ｌレベル信号を制御部４に出力することになる。 However, since the input contact N is in the off state and the photocouplers P3 and P4 are also in the off state, no current flows through the phototransistor T2 of the photocoupler P2. Therefore, at the output timing t3, the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3 are not inverted, and the L level is obtained as the contact input signal S1 and the inspection control answer signal S3. The signal is output to the control unit 4.
　ステップｓ３の出力タイミングｔ５において、制御部４は接点入力部２及び検査電圧印加部３に対して、入力制御信号Ｓ２及び検査制御信号Ｓ４をＨレベル信号にした出力データを出力する。その後に、制御部４は入力タイミングｔ６で接点入力部２からの接点入力信号Ｓ１及び検査電圧印加部３からの検査制御アンサ信号Ｓ３を読み込んで入力データとする。 At the output timing t5 of step s3, the control unit 4 outputs output data in which the input control signal S2 and the inspection control signal S4 are H level signals to the contact input unit 2 and the inspection voltage application unit 3. Thereafter, the control unit 4 reads the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 at the input timing t6 and uses them as input data.
　制御部４は検査制御信号Ｓ４を出力データとしてＨレベル信号を出力し、このＨレベル信号を検査電圧印加部３の入力端子３ｄに入力すると、反転素子ＩＣ４はＨレベル信号の出力をＬレベル信号に反転する。反転素子ＩＣ４の出力をＬレベル信号にすることで、電源電圧ｅから電流が流れ発光ダイオードＤ４が発光する。 The control unit 4 outputs an H level signal using the inspection control signal S4 as output data. When the H level signal is input to the input terminal 3d of the inspection voltage application unit 3, the inverting element IC4 outputs the output of the H level signal to the L level signal. Invert. By making the output of the inverting element IC4 an L level signal, a current flows from the power supply voltage e and the light emitting diode D4 emits light.
　発光ダイオードＤ４が発光すると、フォトトランジスタＴ４に直流電源Ｅから直流電源入力端子３ｂを介して電流が流れ、直列したフォトカプラＰ３の発光ダイオードＤ３が発光する。 When the light emitting diode D4 emits light, a current flows from the DC power supply E to the phototransistor T4 via the DC power supply input terminal 3b, and the light emitting diode D3 of the photocoupler P3 connected in series emits light.
　フォトカプラＰ３の発光ダイオードＤ３が発光すると、抵抗Ｒ７を介して接続した電源電圧ｅからフォトトランジスタＴ３に電流が流れ、反転素子ＩＣ３はＬレベル信号からＨレベル信号に反転し、出力端子３ｃから検査制御アンサ信号Ｓ３のＨレベル信号を出力タイミングｔ５からｄだけ遅延して制御部４に出力することになる。 When the light emitting diode D3 of the photocoupler P3 emits light, a current flows from the power supply voltage e connected through the resistor R7 to the phototransistor T3, and the inverting element IC3 is inverted from the L level signal to the H level signal and inspected from the output terminal 3c. The H level signal of the control answer signal S3 is output to the control unit 4 after being delayed by d from the output timing t5.
　このように、検査制御信号Ｓ４のＨレベル信号を検査電圧印加部３で受信することで、フォトカプラＰ３及びＰ４もオン状態になり、検査電圧入力端子２ｃから接点入力部２に対して電流が流れ込む。 Thus, when the inspection voltage application unit 3 receives the H level signal of the inspection control signal S4, the photocouplers P3 and P4 are also turned on, and a current is supplied from the inspection voltage input terminal 2c to the contact input unit 2. Flows in.
　また、制御部４から入力制御信号Ｓ２のＨレベル信号を接点入力部２に出力すると、上述のように発光ダイオードＤ２が発光する。発光ダイオードＤ２が発光すると、検査電圧印加部３からフォトトランジスタＴ２に電流が流れ、直列したフォトカプラＰ１の発光ダイオードＤ１が発光する。 When the H level signal of the input control signal S2 is output from the control unit 4 to the contact input unit 2, the light emitting diode D2 emits light as described above. When the light emitting diode D2 emits light, a current flows from the inspection voltage applying unit 3 to the phototransistor T2, and the light emitting diode D1 of the photocoupler P1 connected in series emits light.
　そして、フォトカプラＰ１の発光ダイオードＤ１が発光すると、フォトトランジスタＴ１に電流が流れ、反転素子ＩＣ１はＬレベル信号からＨレベル信号に反転する。従って、入力タイミングｔ６において接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１のＨレベル信号及び検査制御アンサ信号Ｓ３のＨレベル信号を制御部４に出力することになる。 When the light emitting diode D1 of the photocoupler P1 emits light, a current flows through the phototransistor T1, and the inverting element IC1 is inverted from the L level signal to the H level signal. Therefore, at the input timing t6, the H level signal of the contact input signal S1 and the H level signal of the inspection control answer signal S3 are controlled as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3. To be output to the unit 4.
　ステップｓ４の出力タイミングｔ７において、制御部４は入力制御信号Ｓ２をＨレベル信号とし、検査制御信号Ｓ４をＨレベル信号からＬレベル信号に切換えた出力データを出力する。検査制御信号Ｓ４をＬレベル信号に切換えて出力すると、フォトカプラＰ３及びＰ４はオフ状態になり、検査電圧入力端子２ｃから接点入力部２に流れ込む電流は停止する。 At the output timing t7 in step s4, the control unit 4 sets the input control signal S2 as an H level signal, and outputs output data in which the inspection control signal S4 is switched from the H level signal to the L level signal. When the inspection control signal S4 is switched to the L level signal and output, the photocouplers P3 and P4 are turned off, and the current flowing from the inspection voltage input terminal 2c to the contact input unit 2 is stopped.
　入力接点Ｎがオフの開放状態であると同時に、フォトカプラＰ３及びＰ４もオフ状態となるため、フォトカプラＰ１及びＰ２を流れる電流も停止する。そして、出力タイミングｔ７からｄだけ遅延して接点入力信号Ｓ１のＨレベル信号の出力は、Ｌレベル信号に切換わる。入力タイミングｔ８において、接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３のＬレベル信号を制御部４に出力することになる。 At the same time that the input contact N is in the open open state, the photocouplers P3 and P4 are also turned off, so that the current flowing through the photocouplers P1 and P2 is also stopped. Then, the output of the H level signal of the contact input signal S1 is switched to the L level signal with a delay of d from the output timing t7. At the input timing t8, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the contact input signal S1 and the L level signal of the inspection control answer signal S3 are output to the control unit 4. It will be.
　ステップｓ５の出力タイミングｔ９において、制御部４は接点入力部２へ入力制御信号Ｓ２をＨレベル信号からＬレベル信号に戻し、検査制御信号Ｓ４をＬレベル信号とし出力データを出力する。そして、入力タイミングｔ１０で、接点入力部２からの接点入力信号Ｓ１と検査電圧印加部３からの検査制御アンサ信号Ｓ３とを読み込んで入力データとする。 At the output timing t9 in step s5, the control unit 4 returns the input control signal S2 from the H level signal to the L level signal to the contact input unit 2, and outputs the output data using the inspection control signal S4 as the L level signal. At the input timing t10, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
　図４は入力接点Ｎがオンの閉成状態で、接点入力部２及び検査電圧印加部３が正常動作時の動作タイミングチャート図を示している。入力接点Ｎがオンであるため、接点電圧入力端子２ａから常時電流が流れ込む。 FIG. 4 shows an operation timing chart when the input contact N is closed and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation. Since the input contact N is on, current always flows from the contact voltage input terminal 2a.
　ステップｓ１の出力タイミングｔ１において、制御部４は接点入力部２への入力制御信号Ｓ２及び検査電圧印加部３への検査制御信号Ｓ４を何れもＬレベル信号とした出力データとして出力する。そして、入力タイミングｔ２においては接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３のＬレベル信号を制御部４に出力することになる。 At the output timing t1 of step s1, the control unit 4 outputs both the input control signal S2 to the contact input unit 2 and the inspection control signal S4 to the inspection voltage application unit 3 as output data that is an L level signal. Then, at the input timing t2, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the L level signal of the contact input signal S1 and the inspection control answer signal S3 is sent to the control unit 4. Will be output.
　ステップｓ２の出力タイミングｔ３において、制御部４は接点入力部２の入力端子２ｅに入力制御信号Ｓ２のみをＬレベル信号からＨレベル信号に切換えて出力した後に、入力タイミングｔ４で接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３を読み込んで入力データとする。 At the output timing t3 of step s2, the control unit 4 outputs only the input control signal S2 from the L level signal to the H level signal and outputs it to the input terminal 2e of the contact input unit 2, and then at the input timing t4, the contact input signal S1 and The inspection control answer signal S3 is read and used as input data.
　制御部４は入力制御信号Ｓ２のみをＨレベル信号として出力し、このＨレベル信号が接点入力部２の入力端子２ｅに入力すると、反転素子ＩＣ２はＬレベル信号に反転する。反転素子ＩＣ２の出力をＬレベル信号にすることで、電源電圧ｅから電流が流れ発光ダイオードＤ２が発光する。 The control unit 4 outputs only the input control signal S2 as an H level signal. When this H level signal is input to the input terminal 2e of the contact input unit 2, the inverting element IC2 is inverted to an L level signal. By making the output of the inverting element IC2 an L level signal, a current flows from the power supply voltage e and the light emitting diode D2 emits light.
　この際に、入力接点Ｎがオン状態であるので、接点電圧入力端子２ａからフォトカプラＰ２のフォトトランジスタＴ２及び直列したフォトカプラＰ１の発光ダイオードＤ１に電流が流れ、発光ダイオードＤ１が発光する。 At this time, since the input contact N is in an ON state, a current flows from the contact voltage input terminal 2a to the phototransistor T2 of the photocoupler P2 and the light emitting diode D1 of the photocoupler P1 in series, and the light emitting diode D1 emits light.
　フォトカプラＰ１の発光ダイオードＤ１が発光すると、フォトトランジスタＴ１に電流が流れ、反転素子ＩＣ１はＬレベル信号をＨレベル信号に反転する。そして、この反転素子ＩＣ１の出力である接点入力信号Ｓ１は、出力からｄだけ遅延してＬレベル信号からＨレベル信号に切換わる。 When the light emitting diode D1 of the photocoupler P1 emits light, a current flows through the phototransistor T1, and the inverting element IC1 inverts the L level signal to the H level signal. The contact input signal S1 that is the output of the inverting element IC1 is switched from the L level signal to the H level signal with a delay of d from the output.
　制御部４からの検査制御信号Ｓ４は、Ｌレベル信号を継続して検査電圧印加部３の入力端子３ｄに出力されているため、フォトトランジスタＴ３及びＴ４はオフのままであり、検査制御アンサ信号Ｓ３はＬレベル信号の出力を継続する。従って、入力タイミングｔ４においては、接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１のＨレベル信号、及び検査制御アンサ信号Ｓ３のＬレベル信号を制御部４に出力することになる。 Since the inspection control signal S4 from the control unit 4 continues to be an L level signal and is output to the input terminal 3d of the inspection voltage application unit 3, the phototransistors T3 and T4 remain off, and the inspection control answer signal In S3, the output of the L level signal is continued. Therefore, at the input timing t4, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the H level signal of the contact input signal S1 and the L level of the inspection control answer signal S3 are used. The signal is output to the control unit 4.
　ステップｓ３の出力タイミングｔ５において、制御部４は接点入力部２への入力制御信号Ｓ２及び検査電圧印加部３への検査制御信号Ｓ４をＨレベル信号にした出力データを出力する。その後に、入力タイミングｔ６で接点入力部２からの接点入力信号Ｓ１と検査電圧印加部３からの検査制御アンサ信号Ｓ３とを読み込んで入力データとする。 At the output timing t5 of step s3, the control unit 4 outputs output data in which the input control signal S2 to the contact input unit 2 and the inspection control signal S4 to the inspection voltage application unit 3 are H level signals. Thereafter, at the input timing t6, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
　制御部４からの入力制御信号Ｓ２のＨレベル信号を継続して接点入力部２の入力端子２ｅに入力すると、前述のように接点入力信号Ｓ１はＨレベル信号の出力を継続する。また、検査制御信号Ｓ４のＨレベル信号を検査電圧印加部３の入力端子３ｄに入力すると、反転素子ＩＣ４はＨレベル信号をＬレベル信号に反転し、フォトトランジスタＴ３及びフォトトランジスタＴ４はオンとなる。 When the H level signal of the input control signal S2 from the control unit 4 is continuously input to the input terminal 2e of the contact input unit 2, the contact input signal S1 continues to output the H level signal as described above. When the H level signal of the inspection control signal S4 is input to the input terminal 3d of the inspection voltage application unit 3, the inverting element IC4 inverts the H level signal to the L level signal, and the phototransistor T3 and the phototransistor T4 are turned on. .
　フォトトランジスタＴ３がオンになることで、反転素子ＩＣ３はＬレベル信号をＨレベル信号に反転し、出力端子３ｃから検査制御アンサ信号Ｓ３のＨレベル信号を出力タイミングｔ５からｄだけ遅延して制御部４に出力することになる。従って、入力タイミングｔ６において接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３のＨレベル信号を制御部４に出力する。 When the phototransistor T3 is turned on, the inverting element IC3 inverts the L level signal to the H level signal, and delays the H level signal of the inspection control answer signal S3 from the output terminal 3c by d from the output timing t5. 4 will be output. Therefore, the contact input signal S1 and the H level signal of the inspection control answer signal S3 are output to the control unit 4 as output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3 at the input timing t6. To do.
　ステップｓ４の出力タイミングｔ７において、制御部４は入力制御信号Ｓ２をＨレベル信号とし、検査制御信号Ｓ４をＨレベル信号からＬレベル信号に切換えた出力データを出力する。その後に、入力タイミングｔ８で接点入力部２からの接点入力信号Ｓ１及び検査電圧印加部３からの検査制御アンサ信号Ｓ３を読み込んで入力データとする。 At the output timing t7 in step s4, the control unit 4 sets the input control signal S2 as an H level signal, and outputs output data in which the inspection control signal S4 is switched from the H level signal to the L level signal. Thereafter, at the input timing t8, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
　ステップｓ４の出力タイミングｔ７において、検査制御信号Ｓ４をＬレベル信号に切換えて出力すると、フォトカプラＰ３及びＰ４はオフ状態になる。しかし、入力接点Ｎがオンの閉成状態であるため、入力制御信号Ｓ２のＨレベル信号の継続入力に対して、フォトカプラＰ１及びＰ２には接点電圧入力端子２ａ経由で電流が流れて、オン状態を維持することになる。 At the output timing t7 of step s4, when the inspection control signal S4 is switched to the L level signal and output, the photocouplers P3 and P4 are turned off. However, since the input contact N is in the closed state, a current flows to the photocouplers P1 and P2 via the contact voltage input terminal 2a in response to the continuous input of the H level signal of the input control signal S2. The state will be maintained.
　従って、入力タイミングｔ８においては、接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１をＨレベル信号、及び検査制御アンサ信号Ｓ３のＬレベル信号を制御部４に出力することになる。 Accordingly, at the input timing t8, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the contact input signal S1 is an H level signal and the inspection control answer signal S3 is an L level. The signal is output to the control unit 4.
　ステップｓ５の出力タイミングｔ９において、制御部４は検査電圧印加部３に検査制御信号Ｓ４のＨレベル信号の出力をＬレベル信号に戻した出力データを出力する。その後に、入力タイミングｔ１０で接点入力部２からの接点入力信号Ｓ１と検査電圧印加部３からの検査制御アンサ信号Ｓ３とを読み込んで入力データとする。 At the output timing t9 in step s5, the control unit 4 outputs output data obtained by returning the output of the H level signal of the inspection control signal S4 to the L level signal to the inspection voltage applying unit 3. Thereafter, at the input timing t10, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.
　制御部４はステップｓ１の出力タイミングｔ１の出力と同様に、出力タイミングｔ９において入力制御信号Ｓ２のＨレベル信号をＬレベル信号に切換え、検査制御信号Ｓ４のＬレベル信号を出力する。 The controller 4 switches the H level signal of the input control signal S2 to the L level signal at the output timing t9, and outputs the L level signal of the inspection control signal S4, similarly to the output at the output timing t1 of step s1.
　入力制御信号Ｓ２をＬレベル信号とした出力データを入力端子２ｅに入力することで、フォトカプラＰ１及びＰ２がオフとなり、出力タイミングｔ９からｄだけ遅延して接点入力信号Ｓ１のＨレベル信号をＬレベル信号に切換えて出力する。従って、入力タイミングｔ１０において、接点入力部２の出力端子２ｄ及び検査電圧印加部３の出力端子３ｃからの出力データとして、接点入力信号Ｓ１及び検査制御アンサ信号Ｓ３のＬレベル信号を制御部４に出力することになる。 By inputting output data in which the input control signal S2 is an L level signal to the input terminal 2e, the photocouplers P1 and P2 are turned off, and the H level signal of the contact input signal S1 is set to L with a delay of d from the output timing t9. Switch to level signal and output. Therefore, at the input timing t10, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the test voltage application unit 3, the L level signal of the contact input signal S1 and the test control answer signal S3 is sent to the control unit 4. Will be output.
　このように、入力接点Ｎがオフの開放状態及びオンの閉成状態の動作タイムチャート図に基づいて、図５及び図６の入力接点Ｎがオフの開放状態及びオンの閉成状態の正常動作時の入出力論理表を作成することができる。 Thus, based on the operation time charts of the open state of the input contact N turned off and the closed state of the on state, the normal operation of the open contact state of the input contact N of FIG. 5 and FIG. 6 and the closed state of the on state of FIG. I / O logical table can be created.
　制御部４からステップｓ１～ｓ５の出力タイミングｔ１、ｔ３、ｔ５、ｔ７、ｔ９の入力制御信号Ｓ２及び検査制御信号Ｓ４のＨレベル／Ｌレベルの出力データに対し、入力タイミングｔ２、ｔ４、ｔ６、ｔ８、ｔ１０の接点入力信号Ｓ１と検査制御アンサ信号Ｓ３のＨレベル／Ｌレベルの入力データと、図５及び図６に示す開放状態／閉成状態の正常動作時の入出力論理とを比較することで、入力接点Ｎがオフの開放状態であるのかオンの閉成状態であるのか、或いは接点入力制御装置１が故障であるのかを判定できる。 Input timings t2, t4, t6, and output timings t2, t3, t5, t7 and t9 from the control unit 4 are input timing signals t2, t4, t6, The H level / L level input data of the contact input signal S1 and the inspection control answer signal S3 at t8 and t10 are compared with the input / output logic during the normal operation in the open / closed state shown in FIGS. Thus, it can be determined whether the input contact N is in an open open state or in an on closed state, or whether the contact input control device 1 is in failure.
　図７は入力接点Ｎの開放状態／閉成状態及び接点入力制御装置１の故障状態の判定を行うフローチャート図であり、フローｆ１において、入力タイミングｔ２、ｔ４、ｔ６、ｔ８、ｔ１０の接点入力信号Ｓ１と検査制御アンサ信号Ｓ３の入力データを収集する。フローｆ２において、これらの入力データと図５の開放状態の入力データを比較し、一致する場合は入力接点Ｎが開放状態であると判定する。 FIG. 7 is a flowchart for determining the open / closed state of the input contact N and the failure state of the contact input control device 1. In the flow f1, the contact input signals at the input timings t2, t4, t6, t8, and t10. Input data of S1 and inspection control answer signal S3 are collected. In the flow f2, these input data and the input data in the open state in FIG. 5 are compared, and if they match, it is determined that the input contact N is in the open state.
　入力データと開放状態の入力データとが一致しない場合には、フローｆ３に進み図６の閉成状態の入力データと比較する。そして、一致する場合は入力接点Ｎが閉成状態であると判定し、一致しない場合は接点入力制御装置１が故障であると判定する。 If the input data does not match the input data in the open state, the flow proceeds to flow f3 and is compared with the input data in the closed state in FIG. If they match, it is determined that the input contact N is in a closed state, and if it does not match, it is determined that the contact input control device 1 is in failure.
　図８は接点入力制御装置１が故障の状態として、例えば入力接点Ｎがオフの開放状態で検査電圧印加部３のフォトカプラＰ４のフォトトランジスタＴ４が導通側に故障したときの動作タイムチャート図であり、図９はこの故障時の入出力論理表を示している。 FIG. 8 is an operation time chart when the contact input control device 1 is in a failure state, for example, when the input transistor N is in an open open state and the phototransistor T4 of the photocoupler P4 of the inspection voltage application unit 3 fails on the conduction side. FIG. 9 shows an input / output logic table at the time of this failure.
　フォトカプラＰ４のフォトトランジスタＴ４が導通側に故障して抵抗Ｒ６を介して接点入力部２の検査電圧入力端子２ｃに直流電源Ｅから電流が流れ続けると、検査制御信号Ｓ４からのＨレベル／Ｌレベルの入力信号に関係なく、検査制御アンサ信号Ｓ３をＨレベル信号として出力する。 If the phototransistor T4 of the photocoupler P4 fails on the conduction side and current continues to flow from the DC power source E to the test voltage input terminal 2c of the contact input unit 2 via the resistor R6, the H level / L from the test control signal S4. The inspection control answer signal S3 is output as an H level signal regardless of the level input signal.
　図９において、○で囲まれた個所は、図５及び図６の出力論理表の何れにも一致しない個所であり、このため図７のフローｆ３において不一致のエラーと判定し、本体内に故障が生じたと判定することになる。 In FIG. 9, the portion surrounded by a circle is a portion that does not match any of the output logic tables in FIGS. 5 and 6, and therefore, it is determined as a mismatch error in the flow f3 in FIG. It is determined that this has occurred.
　なお、この場合は検査制御アンサ信号Ｓ３に不一致が見られることから、検査電圧印加部３が故障していることが分かる。検査電圧印加部３と同様に、１対のフォトカプラＰ１及びＰ２を備える接点入力部２にも、図８、図９に示すような故障が発生する場合がある。この場合には、接点入力信号Ｓ１に対して、図５及び図６の出力論理表と不一致が発生するため、接点入力部２が故障したと判定することができる。 In this case, since a mismatch is found in the inspection control answer signal S3, it can be seen that the inspection voltage application unit 3 has failed. Similar to the inspection voltage application unit 3, the contact input unit 2 including a pair of photocouplers P1 and P2 may have a failure as shown in FIGS. In this case, the contact input signal S1 is inconsistent with the output logic tables of FIGS. 5 and 6, so that it can be determined that the contact input unit 2 has failed.
　また、一時的な回路の接触不良等により、図７のフローｆ３において、不一致による故障とする誤検出を防止するために、所定時間間隔で図７の処理を実行し、所定回数、不一致が連続した場合に、本体内に故障が発生した判定するようにしてもよい。 Further, in order to prevent erroneous detection of failure due to mismatch in the flow f3 of FIG. 7 due to temporary circuit contact failure, etc., the process of FIG. 7 is executed at predetermined time intervals, and the mismatch continues for a predetermined number of times. In such a case, it may be determined that a failure has occurred in the main body.
　このように、従来のパルストランスを備える検査電圧印加部３に対して、パルストランスに代えて、接点入力部２と同様に１対のフォトカプラＰ３及びＰ４を採用することで、回路の小形化、コストの低減を図ることが可能となる。 In this way, the circuit size can be reduced by adopting a pair of photocouplers P3 and P4 in the same manner as the contact input unit 2 in place of the pulse transformer for the inspection voltage application unit 3 having the conventional pulse transformer. It becomes possible to reduce the cost.
　また制御部４において、検査電圧印加部３から検査制御アンサ信号Ｓ３の入力信号を得ることで、接点入力制御装置１内の接点入力部２又は検査電圧印加部３の何れかが異常であることを容易に判定することができる。 Moreover, in the control part 4, by obtaining the input signal of the inspection control answer signal S3 from the inspection voltage application part 3, either the contact input part 2 or the inspection voltage application part 3 in the contact input control device 1 is abnormal. Can be easily determined.
　１　接点入力制御装置
　２　接点入力部
　２ａ　接点電圧入力端子
　２ｂ　マイナス入力端子
　２ｃ　検査電圧入力端子
　２ｄ、３ｃ　出力端子
　２ｅ、３ｄ　入力端子
　３　検査電圧印加部
　３ａ　検査電圧出力端子
　３ｂ　直流電源入力端子
　４　制御部
　Ｅ　直流電源
　Ｎ　入力接点
　Ｐ１～Ｐ４　フォトカプラ DESCRIPTION OF SYMBOLS 1 Contact input control apparatus 2 Contact input part 2a Contact voltage input terminal 2b Minus input terminal 2c Inspection voltage input terminal 2d, 3c Output terminal 2e, 3d Input terminal 3 Inspection voltage application part 3a Inspection voltage output terminal 3b DC power supply input terminal 4 Control Part E DC power supply N Input contact P1 to P4 Photocoupler

Claims (6)

  1. 　接点入力部と検査電圧印加部と制御部とから構成され、
    　前記接点入力部は、外部の直流電源のプラス側と入力接点を介して接続した接点電圧入力端子と、前記直流電源のマイナス側と接続したマイナス入力端子と、前記検査電圧印加部と接続した検査電圧入力端子と、前記制御部に対して接点入力信号を出力する第１の出力端子と、前記制御部から入力制御信号を入力する第１の入力端子とを有し、
    　前記検査電圧印加部は、前記接点入力部の前記検査電圧入力端子と接続し、前記接点入力部に対して検査電圧を印加する検査電圧出力端子と、前記直流電源のプラス側と前記入力接点との間から分岐接続した直流電源入力端子と、前記制御部に対して検査制御アンサ信号を出力する第２の出力端子と、前記制御部から検査制御信号を入力する第２の入力端子とを有し、
    　前記制御部は、前記入力制御信号及び前記検査制御信号に応じた前記接点入力信号及び前記検査制御アンサ信号の出力データと、予め記憶した前記入力接点の開放状態／閉成状態の正常動作時の入出力論理データとに基づいて、前記接点入力の開放状態／閉成状態及び本体内の故障を判定することを特徴とする接点入力制御装置。     Consists of a contact input unit, an inspection voltage application unit, and a control unit,
    The contact input unit includes a contact voltage input terminal connected to the positive side of an external DC power source via an input contact, a negative input terminal connected to the negative side of the DC power source, and an inspection connected to the inspection voltage application unit. A voltage input terminal; a first output terminal that outputs a contact input signal to the control unit; and a first input terminal that inputs an input control signal from the control unit;
    The inspection voltage application unit is connected to the inspection voltage input terminal of the contact input unit, applies an inspection voltage to the contact input unit, a positive side of the DC power source, and the input contact A DC power supply input terminal branched from between, a second output terminal for outputting an inspection control answer signal to the control unit, and a second input terminal for inputting an inspection control signal from the control unit. And
    The control unit is configured to output the contact input signal and the inspection control answer signal corresponding to the input control signal and the inspection control signal, and the pre-stored open state / closed state of the input contact during normal operation. A contact input control device characterized by determining an open / closed state of the contact input and a failure in the main body based on input / output logic data.
  2. 　前記接点入力部は、前記第１の出力端子と接続する第１のフォトカプラと、前記第１の入力端子と接続する第２のフォトカプラを備え、前記第１、第２のフォトカプラは直列接続していることを特徴とする請求項１に記載の接点入力制御装置。 The contact input unit includes a first photocoupler connected to the first output terminal and a second photocoupler connected to the first input terminal, and the first and second photocouplers are connected in series. The contact input control device according to claim 1, wherein the contact input control device is connected.
  3. 　前記接点電圧入力端子及び前記検査電圧入力端子からの前記直流電源のプラス側は、前記第１、第２のフォトカプラを介して、前記マイナス入力端子からの直流電源のマイナス側と接続していることを特徴とする請求項２に記載の接点入力制御装置。 The positive side of the DC power source from the contact voltage input terminal and the inspection voltage input terminal is connected to the negative side of the DC power source from the negative input terminal via the first and second photocouplers. The contact input control device according to claim 2.
  4. 　前記検査電圧印加部は、前記第２の出力端子と接続する第３のフォトカプラ及び前記第２の入力端子と接続する第４のフォトカプラを備え、前記第３、第４のフォトカプラは、直列に接続していることを特徴とする請求項１～３の何れか１項に記載の接点入力制御装置。 The inspection voltage application unit includes a third photocoupler connected to the second output terminal and a fourth photocoupler connected to the second input terminal, and the third and fourth photocouplers are: 4. The contact input control device according to claim 1, wherein the contact input control device is connected in series.
  5. 　前記直流電源入力端子は前記第３、第４のフォトカプラを介して、前記検査電圧出力端子と接続していることを特徴とする請求項４に記載の接点入力制御装置。 5. The contact input control device according to claim 4, wherein the DC power supply input terminal is connected to the inspection voltage output terminal via the third and fourth photocouplers.
  6. 　前記本体内の故障の判定は、前記接点入力部又は前記検査電圧印加部の何れかの故障であることを判定することを特徴とする請求項１～５の何れか１項に記載の接点入力制御装置。 6. The contact input according to claim 1, wherein the determination of a failure in the main body is a failure of either the contact input unit or the inspection voltage application unit. Control device.
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