TWI502207B - Method for testing electrical connection status of a plurality of data lines connected to a panel and associated integrated circuit and display panel module - Google Patents

Description

a method for testing the electrical connection state of a plurality of signal transmission lines connected to a panel And related integrated circuit and display panel module

The invention relates to a method for testing the electrical connection state of a plurality of signal transmission lines connected to a panel, in particular to testing a plurality of signal transmission lines on a panel by using a logic gate group formed in the integrated circuit. The method of electrically connecting the state.

In the panel module, the digital signal is generated by the control board, and the digital signal is transmitted to the driving integrated circuit on the panel through a plurality of signal transmission lines. However, there may be an open circuit or a short circuit on the signal transmission line. Before the panel module is shipped from the factory, it needs to be tested to determine whether the signal transmission line is normal. Generally speaking, it is usually necessary to determine whether there is an open or short circuit on the signal transmission line through actual operation. However, if the amount of displayed data is too large, it is difficult to find an open circuit or a short circuit, so the signal cannot be detected. The problem of the transmission line causes the defective product to flow out to the client.

Accordingly, it is an object of the present invention to provide a method for testing the electrical connection state of a plurality of signal transmission lines connected to one panel and related integrated circuit and display panel modules to solve the above problems.

According to an embodiment of the invention, an integrated circuit includes a plurality of contacts and a logic Gate group and an output unit. The plurality of contacts are respectively connected to the plurality of external signal transmission lines; the logic gate group has a plurality of input terminals coupled to the plurality of contacts in a test mode; the output unit is coupled to the logic gate At least one output of the group, and configured to generate at least one test result signal according to the at least one output signal of the logic gate group, and transmit the at least one test result signal to an output end of the integrated circuit to For judging the electrical connection state of the plurality of external signal transmission lines.

According to another embodiment of the present invention, a display panel module includes a panel and an integrated circuit, wherein the panel is coupled with a plurality of signal transmission lines, and the integrated circuit includes a plurality of contacts and a logic gate group. And an output unit. The plurality of contacts are respectively connected to the plurality of signal transmission lines; the logic gate group has a plurality of input terminals coupled to the plurality of contacts in a test mode; the output unit is coupled to the logic gate group At least one output of the group, and configured to generate at least one test result signal according to the at least one output signal of the logic gate group, and transmit the at least one test result signal to an output end of the integrated circuit for Determining the electrical connection state of the plurality of signal transmission lines.

According to another embodiment of the present invention, a method for testing an electrical connection state of a plurality of signal transmission lines connected to a board includes: providing an integrated circuit, wherein the integrated circuit includes: a plurality of connections The plurality of signal transmission lines are respectively connected to the plurality of signal transmission lines; the plurality of input terminals are respectively coupled to the plurality of contacts in a test mode; and an output unit coupled to the logic gate group At least one output of the group, configured to generate at least one according to at least one output signal of the logic gate group Testing the result signal, and transmitting the at least one test result signal to an output end of the integrated circuit for determining the electrical connection state of the plurality of signal transmission lines; and in a test mode: the logic gate group The plurality of input terminals are respectively coupled to the plurality of contacts; a first set of test signals are input to the plurality of signal transmission lines; after the first test signal is input to the plurality of signal transmission lines, the measurement is performed The output of the integrated circuit is used to obtain a first test result; a second set of test signals is input to the plurality of signal transmission lines; after the second test signal is input to the plurality of signal transmission lines, the integrated body is measured The output of the circuit is used to obtain a second test result; and the electrical connection state of the plurality of signal transmission lines is determined according to the first test result and the second test result.

Please refer to FIG. 1 . FIG. 1 is a schematic diagram of a display panel module 100 according to an embodiment of the invention. As shown in FIG. 1 , the display panel module 100 includes a panel 110 , a driving integrated circuit 120 , and a flexible printed circuit (FPC) 130 , wherein the flexible circuit board 130 is pressed onto the panel 110 , and the panel 110 is connected to M signal transmission lines L1 LM, that is, M signal transmission lines L1 LM LM include a plurality of Indium Tin Oxide (ITO) signal transmission lines fabricated on the panel 110 and signals on the flexible circuit board 130 Transmission line. Further, the drive integrated circuit 120 has M contacts P1 to PM connected to the plurality of signal transmission lines L1 to LM, where M is a positive integer greater than one.

Please refer to FIG. 2, which is a driving integrated body according to a first embodiment of the present invention. A schematic diagram of circuit 200. As shown in FIG. 2, the driving integrated circuit 200 includes a multiplexer 210, a logic gate group 220, and an output unit 230, wherein the multiplexer 210 has two output terminals OUT_1 and OUT_2, and the output terminal OUT_1 is connected to the driver. The integrated circuit 200 is connected to the input terminal of the logic gate group 220; and the logic gate group 220 includes four XNOR gates 222~228. And an OR gate 229. In the following description of the driving integrated circuit 200, it is assumed that the driving integrated circuit 200 receives the digital signals DB0 to DB7 transmitted through the plurality of signal transmission lines L1 to L8 from the plurality of contacts P1 to P8, respectively, however, the contacts The number of signal transmission lines and the number of bits of the digital signal are merely illustrative and are not intended to be limiting of the invention.

In the operation of driving the integrated circuit 200, first, the multiplexer 210 in the driving integrated circuit 200 receives the digital signals DB0~DB7 transmitted through the plurality of signal transmission lines L1 to L8 from the plurality of contacts P1 to P8, respectively. At this time, the multiplexer 210 is switched to a test mode by the control of a control signal Vc, that is, the multiplexer 210 transmits the received digital signals DB0~DB7 to the four anti-mutation or output via the output terminal OUT_2. Inputs of gates 222~228.

Then, the four anti-mutation gates 222-228 respectively perform logical operations on the digital signals DB0~DB7, and the OR gate 229 logically operates the output signals of the anti-mutation or gates 222-228 to generate an output signal Dout. Finally, the output unit 230 receives the output signal Dout and generates a test result Dout', and transmits the test result Dout' to the outside by driving a contact of the integrated circuit 200 for determining whether the signal transmission line L1~L8 has an open circuit or It is a short circuit.

In detail, the driving integrated circuit 200 receives two sets of different digital signals DB0~DB7, and determines whether the signal transmission lines L1~L8 have an open circuit or according to the output signals Dout corresponding to the two different digital signals DB0~DB7. It is a short circuit, wherein the two different digital signals DB0~DB7 are "10101010" and "01010101" respectively. When the digital signals DB0~DB7 are "10101010" and "01010101" respectively, and the output signal Dout of the gate 229 is "0", the electrical connection state of the signal transmission lines L1~L8 is normal (no open circuit or If the output signal Dout of the gate 229 is "1" once, it means that there is an open circuit or a short circuit in the signal transmission line L1~L8.

For example, referring to FIG. 3 and FIG. 4, it is assumed that when the signal transmission lines L1 to L8 are disconnected as in FIG. 3(A) (the signal transmission lines L2 and L5 are disconnected), the digital signals "10101010" and " After 01010101" is input to the signal transmission lines L1 to L8, the voltage levels on the contacts P1 to P8 of the integrated circuit 200 are driven (that is, the digital signals DB0 to DB7 received by the driving integrated circuit 200) are respectively "10100010". And "00010101" (see Fig. 4), therefore, the output signal Dout of the logic gate group 220 is "1"; on the other hand, it is assumed that a short circuit condition occurs as shown in Fig. 3(B) when the signal transmission lines L1 to L8 occur. (A short circuit occurs between the signal transmission lines L1 and L2 and between L4 and L5), and when the digital signals "10101010" and "01010101" are sequentially input to the signal transmission lines L1 to L8, the contacts P1 to P8 of the integrated circuit 200 are driven. The upper voltage level (that is, the digital signal DB0~DB7 received by the driving integrated circuit 200) They are "11111010" and "11011101" (see Fig. 4), respectively, and therefore, the output signal Dout of the logic gate group 220 is "1".

As described above, as long as a short circuit or an open circuit occurs on the signal transmission lines L1 to L8, the output signal Dout of the logic gate group 220 will be "1". Therefore, it is only necessary to judge the output signal Dout of the logic gate group 220. The voltage level can easily know the electrical connection state on the signal transmission lines L1~L8. In addition, the above detection method is simple and requires only a short test time, so that the production line operation is convenient, and no additional inspection equipment is required, and the test cost can be reduced.

In addition, the driving integrated circuit 200 shown in FIG. 2 can only determine whether there is a short circuit or an open circuit on the signal transmission lines L1 to L8, and the present invention can further determine which signal transmission line is electrically connected. The problem with the connection status. Figure 5 is a schematic diagram of a driving integrated circuit 500 in accordance with a second embodiment of the present invention. As shown in FIG. 5, the driving integrated circuit 500 includes a multiplexer 510, a logic gate group 520, and an output unit 530, wherein the multiplexer 510 has two output terminals OUT_1 and OUT_2, and the output terminal OUT_1 is connected to the driver. The integrated circuit 500 is connected to the input terminal of the logic gate group 520; and the logic gate group 520 includes four XOR gates 522 to 528. And the output unit 530 includes four output subunits 532-538. In the following description of the driving integrated circuit 500, it is assumed that the driving integrated circuit 500 receives the digital signals DB0 to DB7 transmitted through the plurality of signal transmission lines L1 to L8 from the plurality of contacts P1 to P8, respectively. It is illustrated by way of example and not as a limitation of the invention.

In the operation of driving the integrated circuit 500, first, the multiplexer 510 in the driving integrated circuit 500 receives the digital signals DB0~DB7 transmitted through the plurality of signal transmission lines L1 to L8 from the plurality of contacts P1 to P8, respectively. At this time, the multiplexer 510 is switched to a test mode by the control of a control signal Vc, that is, the multiplexer 510 transmits the received digital signals DB0~DB7 to the four mutually exclusive or gates via the output terminal OUT_2. The input of 522~528.

Then, four mutually exclusive gates 522-528 respectively perform logical operations on the digital signals DB0~DB7 to generate four output signals Dout1~Dout4. Finally, the four output sub-units 532-538 respectively receive four output signals Dout1~Dout4 and generate four test results Dout1'~Dout4', and drive the four test results Dout1'~Dout4' by driving the integrated circuit 500. At least one contact is transmitted to the outside for judging whether the signal transmission lines L1 to L8 are open or shorted.

In detail, the driving integrated circuit 500 receives two sets of different digital signals DB0~DB7, and determines whether the signal transmission lines L1~L8 have an open circuit or according to the output signals Dout corresponding to the two different digital signals DB0~DB7. It is a short circuit, in which the two different digital signals DB0~DB7 are "10101010" and "01010101" respectively, and when the digital signals DB0~DB7 are "10101010" and "01010101" respectively, the output signals Dout1~Dout4 are " 1", it means that the electrical connection state of the signal transmission line L1~L8 is normal (no open circuit or short circuit); and if one of the output signals Dout1~Dout4 has "0" once, it means relative There should be an open or short circuit in the signal transmission line. For example, if the value of the output signal Dout1 is “0”, it means that one of the signal transmission lines L1 or L2 has an open circuit or a short circuit.

In addition, it should be noted that the above-mentioned driving integrated circuit 200 and the driving integrated circuit 500 all assume that there are only eight digits of data. However, in other embodiments of the present invention, multiple signals can be received by multiple signal transmission lines. The digital data can be easily applied to the present invention based on the teachings of the above embodiments, and the details will not be described again.

Briefly summarized, the present invention is a method for testing the electrical connection state of a plurality of signal transmission lines connected to one side of the board, and the related integrated circuit and display panel module, which are arranged in the driving product. A logic gate group in the body circuit determines the electrical connection state of the signal transmission line, so that the test can be easily performed and only a short test time is required, so that the production line operation is convenient and no additional detection is required. Equipment can reduce test costs.

The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.

100‧‧‧Display panel module

120, 200, 500‧‧‧ drive integrated circuits

130‧‧‧Soft circuit board

210, 510‧‧‧ multiplexers

220, 520‧‧‧ logical gate group

222, 224, 226, 228‧‧‧ anti-mutation or gate

522, 524, 526, 528‧‧‧ mutually exclusive or gate

229‧‧‧ or gate

230, 530‧‧‧ Output unit

532, 534, 536, 538‧‧‧ output subunits

P1~PM‧‧‧Contact

L1~LM‧‧‧ signal transmission line

DB0~DBN‧‧‧ digital signal

FIG. 1 is a schematic diagram of a display panel module according to an embodiment of the invention.

Fig. 2 is a schematic view showing a driving integrated circuit according to a first embodiment of the present invention.

Figure 3 is a schematic diagram of the open and short circuit of the signal transmission line.

Fig. 4 is a schematic diagram of the digital signal received by the driving integrated circuit when the signal transmission line is broken and short-circuited as shown in Fig. 3.

Fig. 5 is a schematic view showing a driving integrated circuit according to a second embodiment of the present invention.

200‧‧‧Drive integrated circuit

210‧‧‧Multiplexer

220‧‧‧Logic gate group

222, 224, 226, 228‧‧‧ anti-mutation or gate

229‧‧‧ or gate

230‧‧‧Output unit

Claims (11)

A display panel module includes: a panel connected to a plurality of signal transmission lines; and an integrated circuit, wherein the integrated circuit includes: a plurality of contacts respectively connected to the plurality of signal transmission lines; The gate group has a plurality of input terminals coupled to the plurality of contacts in a test mode, wherein the logic gate group is configured to the plurality of signals for the plurality of signals respectively from the plurality of contacts And performing at least one output signal to be coupled to the at least one output of the logic gate group And testing the result signal, and transmitting the at least one test result signal to an output end of the integrated circuit for determining the electrical connection state of the plurality of signal transmission lines. The display panel module of claim 1, wherein the logic gate group comprises: a plurality of XNOR gates, wherein the input ends are respectively coupled to the plurality of contacts; An OR gate, wherein one of the inputs of the OR gate is electrically connected to the plurality of outputs of the plurality of anti-mutation or gates, and one of the output terminals of the gate is the logic gate group The output. The display panel module of claim 1, wherein the logic gate group has a plurality of output terminals, and the logic gate group includes: a plurality of XOR gates, wherein the complex number The plurality of inputs of the mutual exclusion or gate are respectively coupled to the plurality of contacts, and the plurality of outputs of the plurality of mutually exclusive or gates are the plurality of outputs of the logic gate group. The display panel module of claim 3, wherein the output unit comprises: a plurality of output sub-units coupled to the plurality of outputs of the plurality of mutually exclusive or gates, wherein each output The subunit generates a corresponding test result signal according to the corresponding mutually exclusive or gate output signal, and transmits the corresponding test result signal to an output end of the integrated circuit for judging coupling to the Corresponding to the electrical connection status of the external signal transmission line of the mutex or gate. The display panel module of claim 1, which is applied to a driving integrated circuit of a display panel. The display panel module of claim 1, wherein the plurality of signal transmission lines comprise a plurality of Indium Tin Oxide (ITO) signal transmission lines fabricated on the panel. The display panel module of claim 1, wherein the plurality of signals The transmission line includes a signal transmission line that is pressed onto a flexible circuit board on the panel. A method for testing an electrical connection state of a plurality of signal transmission lines connected to a board includes: providing an integrated circuit, wherein the integrated circuit includes: a plurality of contacts respectively connected to the plurality of signals a transmission line; a logic gate group having a plurality of input terminals coupled to the plurality of contacts in a test mode; and an output unit coupled to the at least one output end of the logic gate group And generating at least one test result signal according to the at least one output signal of the logic gate group, and transmitting the at least one test result signal to an output end of the integrated circuit for determining the electrical property of the plurality of signal transmission lines a connection state; and in a test mode: coupling the plurality of inputs of the logic gate group to the plurality of contacts; and inputting a first group of test signals to the plurality of signal transmission lines; After the first test signal is input to the plurality of signal transmission lines, the output of the integrated circuit is measured to obtain a first test result; and a second set of test signals is input to a plurality of signal transmission lines; after the second test signal is input to the plurality of signal transmission lines, measuring the output end of the integrated circuit to obtain a second test result; and according to the first test result and the second test The result is used to determine the electrical connection state of the plurality of signal transmission lines. The method of claim 8, wherein the logic gate group comprises: a plurality of XNOR gates, the input ends of which are respectively coupled to the plurality of contacts; and a gate (OR gate), wherein one of the inputs of the OR gate is electrically connected to the plurality of outputs of the plurality of anti-mutation or gates, and one of the outputs of the OR gate is the output of the logic gate group And the method further includes: when the first set of test signals are input to the plurality of signal transmission lines, a first input end and a second input end of each anti-mutation or gate respectively receive a logic a 0" signal and a logic "1" signal; and when the second group of test signals are input to the plurality of signal transmission lines, the first input terminal and the second input terminal of each anti-mutation or gate are respectively received A logical "1" signal and a logical "0" signal. The method of claim 8, wherein the logic gate group has a plurality of outputs, and the logic gate group comprises: a plurality of XOR gates, wherein the plurality of mutually exclusives The plurality of inputs of the gate are respectively coupled to the plurality of contacts, and the plurality of outputs of the plurality of mutually exclusive or gates are the plurality of outputs of the logic gate group; and the method further includes When the first set of test signals is input to the plurality of signal transmission lines, a first input end and a second input end of each of the mutually exclusive or gates are respectively received a logic "0" signal and a logic "1" signal; and when the second group of test signals are input to the plurality of signal transmission lines, the first input terminal and the second input terminal of each mutexe or gate are respectively A logic "1" signal and a logic "0" signal are received. The method of claim 8, wherein the integrated circuit is a driving integrated circuit applied to a display panel.