TW494232B - Method and apparatus for inspecting simple-matrix type liquid crystal panel, and method and apparatus for inspecting plasma display panel - Google Patents

Method and apparatus for inspecting simple-matrix type liquid crystal panel, and method and apparatus for inspecting plasma display panel Download PDF

Info

Publication number
TW494232B
TW494232B TW90100952A TW90100952A TW494232B TW 494232 B TW494232 B TW 494232B TW 90100952 A TW90100952 A TW 90100952A TW 90100952 A TW90100952 A TW 90100952A TW 494232 B TW494232 B TW 494232B
Authority
TW
Taiwan
Prior art keywords
electrodes
electrode
voltage
aforementioned
foregoing
Prior art date
Application number
TW90100952A
Other languages
Chinese (zh)
Inventor
Shogo Ishioka
Shuji Yamaoka
Original Assignee
Oht Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oht Inc filed Critical Oht Inc
Application granted granted Critical
Publication of TW494232B publication Critical patent/TW494232B/en

Links

Classifications

    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

The present invention relates to method and apparatus for inspecting simple-matrix type liquid crystal panel, and relates to method and apparatus for inspecting plasma display panel, in which a broken circuit of electrode can be more easily inspected. The present invention is an inspecting method for inspecting broken circuits of plural electrodes 100, 101 possessed by a panel B. Either of the electrodes 100, 101 is selected and a time-varying voltage is supplied to an end of the selected electrode 101a such that a voltage appearing on the electrode 100a, which crosses perpendicularly to the selected electrode 101a, through a capacitance due to the voltage supplied to the electrode 100a is measured. The measured voltage is then judged by a computer 6 to determine whether it is within a predetermined range or not so as to judge if there is any broken circuit present in the electrode 101a.

Description

494232 五、發明說明Ο) [發明之詳細說明] [技術領域] 本發明係關於-種電路基板之檢查方法 關於檢查;ί單純矩陣型液晶面板或電浆顯丄ΐ電; 之斷線之檢查方法及檢查裝置者。 槪之電極 [背景技術] 液晶面板及電漿顯示面板為,在相對之一 在-方之基板上,設有複數個沿著行方向之線::: 描電極,在另一方之基板上,設有複數m = 掃描電極交叉之)之線狀之所謂訊 力而形成圖像。 以该4供給甩 在上述之液晶面板等中,在其製一 無斷線。 甲而要才双查各電極有 關於該檢查之方法,古@ & _L , ^ ^ ^義把探針接觸於檢省對象少+ 成為高密度化之近年來在面板之插裝密度 端不-定是容易,把探針接觸於電極兩 而2 δΓ本來不需要的檢查用墊之問題存在。 有 於疋,關於要解決該問題之檢查 本案特開平7-1 46323號公報記載之檢杳方:如曰 忒榀查方法為,對·成為檢杳 一方去。 時間變化之訊號,非接觸探象在=電壓會因 接觸探針之間之靜電容量而 >=山猎由^丨在於该電極與非 , Lp 4 K 双〉則出現在該非接觸4菜 a康該訊號之強度來檢測電極之斷線。以該檢查 90100952.ptd _ $ 4頁 494232 五、發明說明(2) ,::”極之—端設檢查用墊則 μ 在曰本專利申請案特開平7〜< 點。 $法也需要非接觸探針的關係,有 0 3 2 3號記載之檢查 一順序之複雜化之可能性。 數置之複雜化,檢 因此,本發明之目的,在於提供一 電極之斷線之單純矩陣型液晶面板能约更簡單地檢查 置,以及電漿顯示面板之檢查 ,i方法及檢查裝 [發明之揭示] 檢查裒置者。 =發明係用以檢查單純矩陣型液晶面 …=之斷線之檢查方法,係包括: 板所具有之複數條 2擇電極中之任何一條電極,對壁 a卩返著時間變化之電壓之步驟, &擇之電極之一端供 就與前述所選擇之電極垂直交又 ::~條電極,計測因供給前述電屙:2條前述電極中之 之叶測步驟, 土之、、、口果所出現之電壓 前述所計測之電壓是否在 述選擇之電極為,從前述一端至在d圍内來判斷,前 電壓之前述電極為止之間之部分,r 21步驟中所計測 步驟, ]&丨刀疋否有發生斷線之判斷 $ ΐ特徵之單純矩陣型液晶面板之檢查方法者 ,吩,在前述計測步驟中,於 ζ 。 電極之複數條前述電極當中,就離二所選擇之 端最遠位置之雷# ^ ?尤離開别述遠擇之電極之一 1之電極,也可計測前述電嬋者。 又,也可包含: 电&牙 90100952.ptd 第5頁 五、發明說明(3) 在前述判斷+ 與前述所選擇二=中,判斷為前述電極有發生斷線時,在 位於比在前述垂直父又之複數條前述電極當中,就 —端側位置之::步驟中計測電壓之前述電極更靠近前述 出現之電屋極,依次計利供給前述電愿之結果所 特別指定今、^刼, 斗寸定前述選擇^ ^计'則之電壓在預定範圍内之電極,藉以 又,根據極之斷線部位之步驟者。 所具有之複數ί = Φ可提供一種檢查單純矩陣型液晶面板 選擇前4:ί!極之斷線用之檢查方法,係包含: 分供給隨著時η::之任一電極’對所選擇之電極之-部 就與前之電厂堅之步驟, ί :―電㉟,計測因供給前述電壓述電極當中 之計測步驟, ⑴4电&艾結果所出現之電壓 根據别述計測之電壓 之電極為,在白义、+、 在1疋之乾圍内,前述所選擇 前述電極為止之;;::t分至丽述計測步驟中計測電壓之 ,為其特彳f分’判斷是否發生斷線之判斷步驟 陣型液晶面板之檢查方法者。 根據本發明’可提供一種檢查單純矩陣型液 ;:ί稷數條之電極之斷線用之檢查方法,係包;· 遠擇W述電極當中之任一電極,對 3 . 著時間而變化之電壓之步驟, 、 電極供給隨 就與前述所選擇之電極垂直交叉之複數 別計測因供給前述電壓之結果所出現之電壓之計測步驟々 \\312\2d-code\90-03\90100952.ptd 第6頁 五、發明說明(4) ___________ 互相比較前述戶斤士+、、目丨 之電極當中’ 選擇之電極垂直交叉 ,也可計測前述電塵者严有所線之區域中之前述電極 又^日卞’砌述計測步驟為,就# 一 直交叉之全部雷朽, ”·、尤輿前述所選擇夕干』 又,該時,也可計測前述電塵者。之電極垂 ^ 可包含判斷為太# 發生斷線時,在前述所二:斷:驟中前述所選擇 屢有變化之前述電極之結果U璧當中,特別 擇之電極之斷線部位之步驟者。,可特別指定前述選 又,根據本發明,可提供一 、 之電極之斷線用之檢查方;電:3面板所具有 選擇則述電極當中夕杠+』杳,係包含: β 供給隨著時間而變 二對所選擇之電極 之所選擇之電複數侔、, " 計測步驟:,計測因供給前述電壓(结果所::電極當中 根據前述計測之 之電堡之 之電極為,在 i疋否在預定之範圍内,前 述電極為止之=刚述一端至前述計挪步驟中計測ί所選擇 為其特徵之電二:部分’判斷是否發生斷線之判斷壓之前 又,根搪Γ水不面板之檢查方法者。 岍步驟, 據本發明,可提供一種檢查電衆 面板所具有 90100952 第7頁 494232 五、發明說明(6) 計剛機^ · 5十測因供給前述電壓之社果痛 /钺構, °果所出現之電壓之 根據前述所、θϊ 擇之雷搞五十電壓是否在預定之r w 俞、+、"為,在自前述一端至以义、+、 &圍内’前述所選 :j;電極為止之間之部分計剛機構計測電遷之 ς $特徵之單純矩 ^ =生斷線之判斷機 乂亥時,前述計測機構:液檢查裝置者。 之電極當中,離為人則述所選擇之雷κ千古丄 極也可^、,_ w述所選擇之電極之^電極垂直交又 了计測珂述電壓者。 之—端最遠位置之電 又’该時,可且 、, 生斷線時,前#、二田别述判k/f機構判斷 ^ 交戈夕:去述叶測機構為,在盥前if ^為則述電極有發 之稷數之前述電極當中,、述所選擇之電極垂直 靠近前述-端之;計測Μ之前ί 二,後所出現之電麼,二依次計測因供給前 、疋之範圍内之電極,萨以牯 ^ :述所計測之電壓在 斷線部位之機構者。3寺別私定前述所選擇之電極之 又,根據本發明,可 所具有之複數條之 「 檢查單純矩陣型液晶面# 斟f今、十、予』 電極之斷線用之檢杳裝置,隹目1板 w對攸則述電極當中所選 =一衣置,係具備有: 者時間而變化之電壓之機 電極之一部分,供給隨 就與前述所選摆夕帝 之任-電極,計測因:二2 f之複數條前述電極當中 計測機構, υί、,,Ό則述電麼之結果所出現之電屋= 根據别述计測之雷嚴3 电&疋否在預定之範圍内,前述所選擇 \\312\2d-code\90-03\90100952.ptd 五、發明說明(7) 之電極為,在白今、+、 ^、 述電極為止之問二^八°、刀至則述計測機構計測電壓之前 為其特徵之單二矩陣:3斷是否發生斷線之判斷機構, 又’根據本發明,可‘:面3二$查裝置者。 所具有之複數條之電陣型液晶面板 對從前述電極當中所選擇之=—衣置,係具備有: 變化之電壓之機構, 電極,供給隨著時間而 就與前述所選擇之電極垂 之電極,計測因供給 条可述電極當中 機構, 之、、Ό果所出現之電壓之計測 互相比較前述計測之電壓士 極是否發生斷線之判斷機構,為斷f述所選擇之電 面板之檢查裝置者。 ’、、、/、寺铽之單純矩陣型液晶 2時,前述計測機構係與前述選 口中’就包含在可料想斷線 父又之電 測珂述電壓者。 x Η之刖述電極,可計 又,該時,前述計測機構係與前述 之全部電極,也可計測前述電壓者。 〃亟垂直交又 又,遠犄,可具備有當前述判斷機 1 之電極有斷線時,在前述所計測之各電3^述所選擇 該電壓有變化之前述電極之結果,能;;二2別指定 之電極之斷線部位之機構者。 々別扣疋則述選擇 又’根據本^曰月’可提供一種檢查電喂示 之複數條之電極之斷線用之檢查裝置,係具備有板所具有 第10頁 90100952.ptd 造擇刖 供給隨著 就與前 之任一電 計測機構 根據前 之電極為 電極為止 其特徵之 又,根 之複數條 選擇前 ,供給隨 就與前 之任一電 計測機構 根據前 之電極為 述電極為 為其特徵 又,根 之複數條 選擇前 時間而變 述電極中 時間而變 述所選擇 極,計測 述計測之 ’在自前 之間之部 電漿顯示 據本發明 之電極之 述電極中 者日·'間而 述所選擇 極,計測 述計測之 ’在自前 止之間之 之電漿顯 據本發明 之電極之 述電極中 化之電壓 之任一電極, 化之電壓之機 之電極垂直交 因供給前述電 對所選擇之電極之 構, ^之複數條前述電極當中 麼之結果所出現之電璧之 端 電壓是 述一端 分,判 面板之 ,可提供一種 否在預 至前述 斷是否 檢查裝 斷線用 之任一 變化之 之電極 因供給 之檢查 電極, 電壓之 垂直交 前述電 定之 計測 發生 置者 檢查 裝置 對所 機構 又之 壓之 範圍内,前述所選擇 機構計測電壓之前述 斷線之判斷機構,為 〇 電漿顯示面板所具有 ’係具備有: 選擇之電極之一部分 5 才旻數條前述電極當中 、结果所出現之電壓之 述在f疋之範圍0,前述所選擇 部八^,二f Γ述計測機構計測電壓之前 ;::断是否I 1斷線之判斷機構, 不面板之檢查裝置者。 可k供一種拾本+ U ^ m 查電漿顯示面板所具有 ::用:檢查裝置,係包含有: 之機構,# ’對所選擇之電極供給隨著494232 V. Description of the invention 0) [Detailed description of the invention] [Technical field] The present invention relates to a method for inspecting a circuit board; an inspection; a simple matrix liquid crystal panel or a plasma display; an inspection of a broken wire Method and inspection device.电极 的 electrode [Background Technology] The liquid crystal panel and the plasma display panel are provided with a plurality of lines along the row direction on the opposite side of the-side substrate: :: tracing electrodes on the other side of the substrate, An image is formed by setting a so-called signal force in the form of a plurality of lines (m = scanning electrode cross). With this 4 supply, in the above-mentioned liquid crystal panel and the like, there is no disconnection in the system. A. It is necessary to double check each electrode for the inspection method. Ancient @ & _L, ^ ^ ^ means that the probe is in contact with less inspection objects + has become high density. In recent years, the density density of the panel has not been improved. -It must be easy. There is a problem in that the probe is in contact with both electrodes and 2 δΓ is not needed for an inspection pad. With regard to the inspection to solve this problem, the prosecutor described in Japanese Patent Application Laid-Open No. 7-1 46323: If the investigation method is, the inspection party shall be the right to become the prosecutor. The signal of time change, the non-contact image is = the voltage will be due to the electrostatic capacity between the contact probes> = mountain hunting ^ 丨 lies in the electrode and non, Lp 4 K double> appears in the non-contact 4 Use the strength of the signal to detect the disconnection of the electrode. Take this inspection 90100952.ptd _ $ 4 pages 494232 V. Description of the invention (2): "Extremely-set inspection pads μ" In Japanese Patent Application Laid-open No. 7 ~ < point. The $ method also needs The relationship of the non-contact probe has the possibility of complication of the inspection-order described in No. 0 2 2 3. The complication of the number of inspections is, therefore, the object of the present invention is to provide a simple matrix type of disconnection of an electrode. The LCD panel can be inspected more easily, as well as the inspection of the plasma display panel, the i method and the inspection device. [Invention of the Invention] The inspector. = The invention is used to inspect the simple matrix type LCD surface ... The inspection method includes: any one of a plurality of 2 selective electrodes of the board, a step of returning a time-varying voltage to the wall a, and one end of the selected electrode is perpendicular to the aforementioned selected electrode. Crossover :: ~ electrodes, measure the supply of the aforementioned electricity: the leaf measurement steps in the 2 aforementioned electrodes, the voltage appearing in the soil ,,, or fruit, whether the aforementioned measured voltage is the selected electrode, From the aforementioned end to within d Judgment, the part between the aforementioned electrodes up to the previous voltage, the measurement steps in step 21,] & 丨 Whether there is a disconnection judgment $ ΐ Characteristic of the simple matrix type LCD panel inspection method, phen, In the aforementioned measuring step, among the plurality of electrodes of the zeta electrode, the thunder farthest from the two selected ends # ^? In particular, the electrode 1 leaving one of the other remotely selected electrodes may also be measured. In addition, it may also include: electricity & teeth 90100952.ptd page 5 5. Description of the invention (3) In the foregoing judgment + and the aforementioned selected two =, when it is judged that the electrode is disconnected, the It is located in the front-end position than the plurality of aforementioned electrodes in the aforementioned vertical parent: the aforementioned electrode for measuring the voltage in the step is closer to the aforementioned electric house electrode, and it is specifically designated as the result of the profit supply in order Now, ^ 刼, the electrode of the above selection ^ ^ Calculates the electrode whose voltage is within a predetermined range, and according to the step of the pole's disconnection part. The complex number ί = Φ can provide a check simple matrix Type fluid The method for inspecting the front panel selection of 4: ί! Poles, including the following steps: Sub-supply any one of the electrodes η :: over time. , Ί: ―Electrical energy, measuring the measurement steps due to the aforementioned voltage supplied to the electrode, the voltage appearing in the result of the electric power & Ai according to the other measured voltage is the electrode in Baiyi, +, and 1 疋Within the range, until the aforementioned electrode is selected ;; :: t points to the measured voltage in the Lishu measurement step are its special points f 'to determine whether a disconnection has occurred. Steps of the array LCD panel inspection method. The present invention can provide a simple matrix type liquid ;: check method for disconnection of several electrodes, the package; · remotely select any one of the electrodes described above, and 3. change with time The voltage step is based on the plural steps of electrode supply that perpendicularly intersect the selected electrode. Measurement steps for measuring the voltage appearing as a result of the supply of the aforementioned voltage. \\ 312 \ 2d-code \ 90-03 \ 90100952.ptd Page 6 V. Description of Invention (4) ___________ Compared to the aforementioned electrodes of the households +, and the electrodes, the 'selected electrodes cross vertically, and it can also measure the aforementioned electrodes in the area where the aforementioned electric duster is strictly lined, and the measurement steps are as follows: # All the crosses that have been crossed all the time, "·, You Yu selected the above-mentioned evening dry" Also, at this time, you can also measure the aforementioned electric dust person. The electrode vertical ^ may include the step of judging that the wire is broken, in the aforementioned second: break: step, the result of the aforementioned electrode that has been repeatedly selected in the previous step U 璧, the step of the specially selected electrode's disconnection site . According to the present invention, the inspection method for the disconnection of the electrodes can be provided; electricity: the choice of 3 panels has the electrode + + 电极, which includes: β As time changes, the two selected electric complexes of the selected electrode are measured. &Quot; Measurement steps: The measurement is performed due to the supply of the aforementioned voltage (result: the electrode among the electrodes according to the aforementioned measurement of the electric fort is: i疋 If it is within the predetermined range, the value from the previous electrode to the previous measurement to the measurement step above is selected. 电 The electric characteristics selected as its characteristics are as follows: Partially, it is judged whether the disconnection occurs. Those who do not check the panel. (1) According to the present invention, it is possible to provide a method for inspecting the panel of the electric panel. 90100952 Page 7 494232 V. Description of the invention Pain / 钺 struct, ° If the voltage appearing according to the above, θϊ chooses whether the 50 voltage is within the predetermined rw, Yu, +, " is, from the aforementioned end to the Yiyi, +, & Within the 'selected previously: j; part of the mechanism between the electrode and the electrode is measured by the electrical mechanism. $ The simple moment of the characteristic ^ = When the disconnection judging machine is in use, the foregoing measurement mechanism: the liquid inspection device. Among the electrodes, it is described as a person. The selected lightning kappa pole can also be used to measure the voltage of the electrode. The electrode of the selected electrode is perpendicularly crossed to measure the voltage of the electrode. When the line breaks, the former #, Erita does not judge the k / f mechanism to judge ^ Jiao Xi: To describe the leaf measurement mechanism is, among the aforementioned electrodes, if the before ^ is the number of the electrodes, 2. Describe the selected electrode vertically close to the aforementioned-terminal; measure the electricity before and after the two, and then measure the electrodes that are in the range of before and after the supply, in order to measure the voltage. Sa: Those who are at the disconnection site. 3 Temples shall privately select the electrodes selected above. According to the present invention, there may be a plurality of "check simple matrix liquid crystal planes." Detection device for disconnection, 1 board, 1 pair of electrodes selected for each electrode = one set, equipped with There are: A part of the machine electrode of the voltage which changes with time, and it is provided with the above-selected oscillating emperor-electrode. The measurement reason is: 2 2 f. Among the foregoing electrodes, the measurement mechanism is The result of the electricity described above appears in the electricity house = the lightning severity measured according to another description 3 electricity & whether it is within the predetermined range, the aforementioned choice \\ 312 \ 2d-code \ 90-03 \ 90100952.ptd five 2. The electrode of invention description (7) is a single-two matrix with characteristics before Baijin, +, ^, the above mentioned electrodes, ^ °, and the knife to the measurement mechanism before measuring the voltage: whether 3 breaks occur The judging mechanism of the line is also 'according to the present invention,': those who check the device. The plurality of electrically-arrayed liquid crystal panels have a selection of the above-mentioned electrodes = —clothing, which are provided with: a mechanism for changing voltages, electrodes, and the electrodes that are perpendicular to the selected electrodes over time The mechanism for measuring the voltage among the electrodes that can be described by the supply bar, and the measurement of the voltage appearing in the capsules are compared with each other to determine whether the voltage of the measured voltage pole is disconnected. It is the inspection device for the electric panel selected in accordance with f. By. In the case of the simple matrix type liquid crystal 2 of Terashima, the measurement mechanism and the option described above are included in those who are expected to break the line and the electric voltage is measured. The above-mentioned electrodes of x Η can be measured. At this time, the aforementioned measuring mechanism and all the aforementioned electrodes can also measure the aforementioned voltage. It can be vertical and far, and it can be equipped with the result of the aforementioned electrode that has a change in the selected voltage when the electrodes of the aforementioned judgment machine 1 are disconnected; 2 2 Do not designate the mechanism of the disconnected part of the electrode. 々Don’t deduct the option, and according to this article, you can provide an inspection device for inspecting the disconnection of multiple electrodes of the electric feeder, which is equipped with the board. Page 10 90100952.ptd The characteristics of the supply with any of the previous electrical measuring mechanisms according to the previous electrode are the same. Before the plurality of roots are selected, the supply is with any of the previous electrical measuring mechanisms according to the previous electrode. For its characteristics, the plural pieces of the root select the time in the electrode and change the time in the electrode to change the selected pole, and the measurement of the measured 'plasma in the front shows the day of the electrode according to the electrode of the present invention · The selected electrode in between, the measurement described in the measurement is measured. The plasma between the front and the back shows the voltage of any electrode in the electrode of the present invention, and the electrode of the voltage generator is perpendicular to each other. Due to the structure of the electrodes selected for supplying the foregoing electric pairs, the terminal voltage of the electric terminals appearing as a result of the plurality of the foregoing electrodes is the one-end division. Judging the panel, it can provide whether the Any change of the electrode used for checking the installation of the broken wire is due to the supply of the inspection electrode, and the voltage perpendicular to the above-mentioned electrical measurement is generated by the inspection device. The aforementioned mechanism for judging the disconnection of the voltage is that the plasma display panel has the following: a part of the selected electrode 5; among the foregoing electrodes, the description of the voltage appearing in the result is in the range 0 of f 疋, The aforementioned selected parts 部, f and f f described before the measuring mechanism measures the voltage; ::: the judgment mechanism of whether the I 1 is disconnected, or the panel inspection device. Can be used for a kind of pick-up + U ^ m check plasma display panel has :: use: inspection device, including: mechanism, # ’to the selected electrode supply with

90100952.ptd 第11頁 五、發明說明(9) 就與前述所選擇之 計測因供給前述電壓之結果+ ^叉之複數條前述電極分 相比較根據前述所計測之各電壓=:壓之計測機構,互 之電極為是否發生斷線之^斷掬、,,°甘判斷前述所選擇 面一板之檢查裝置者。 ㈣構,為其特徵之電製顯示 [實施發明之最佳形態] STN在本紐發明中’上述所謂單純矩陣型液θ面杯r ^ ^ TN ^ ^ ^ 时;圖r=:::電極及訊號電極之= 圖1為顯示有關本發v之之义實二形態說明如下。 略w表示以檢查“A所;。=== ’或電漿顯示面板之面板二二l夜曰曰面板 電極群1 〇 〇及10 J係八夫* ° _ 〇 〇及101之圖。又, 之群。 ”刀相s於掃瞄電極,訊號電極之電極 嫩係具備有:對電極群100或101供給隨著時間 ί屏5访ΐ之汛號發生器1,將出現於電極群10〇或101之 卢二/ί及過濾用之訊號處理器2,計測由訊號處理器2 处之Λ〜之不波器3,連接於各電極群1 0 0或1 0 1之探針 4^木針4與δίι就發生器1或訊號處理器2或GND之間實行 、 換之夕路轉換器5,用以控制該等及判定電極之斷 線及特=指定斷綠位置之電腦6者。90100952.ptd Page 11 V. Description of the invention (9) Compared with the result of the aforementioned selected measurement due to the supply of the aforementioned voltage + a plurality of the aforementioned electrodes divided by ^ fork, the respective voltages measured according to the aforementioned =: voltage measuring mechanism The mutual electrode is the inspection device that determines whether a disconnection has occurred. The structure shows the characteristics of the electrical system [the best form of implementing the invention] STN in the invention of the above-mentioned so-called simple matrix type liquid θ surface cup r ^ ^ TN ^ ^ ^; Figure r = ::: electrode And the signal electrode = Figure 1 shows the meaning of the second form of the present v is explained below. Slightly w means to check "A place;" === 'or the panel of the plasma display panel. The panel electrode group 1 00 and 10 J is a figure of the eighth husband * ° _ 00 and 101. The group of electrodes. "The knife phase is on the scanning electrode. The electrode electrode of the signal electrode is equipped with: the electrode group 100 or 101 is supplied with the time to visit the flood generator 1 in the screen 5 and will appear in the electrode group 10. 〇 or 101 of Lu Er / Li and filtering signal processor 2, measuring Λ ~ wave filter 3 at signal processor 2, connected to each electrode group 1 0 0 or 1 0 1 probe 4 ^ The wooden needle 4 and δ are implemented between the generator 1 or the signal processor 2 or the GND, and the inverter 5 is used to control these and determine the disconnection of the electrode and the computer 6 that specifies the green disconnection position. .

訊號發生器1係依照電腦7之指令而發生隨著時間變化之 訊號者。隨著時間變化之電屢之程度(頻率)為,例如A 第12頁 \\312\2d-code\90-03\90100952.ptd 494232 五、發明說明(10) 5 0 0kHz至10MHz之間為宜。又,發生之訊號為,矩形波狀 之直流,或交流均可。又,訊號發生器丨係與電腦7之指令 無關地,經常發生該訊號者也可以。 訊號處理器2係實行從出現於電極群][〇〇或1〇1之電壓中 除去雜訊等之過濾處理,及放大電壓電位之處理等者1。 示波器3係從訊號處理器2所送出之訊號來計測其電壓電 位者。其計測結果是送至電腦6。 探針4係個別分配於電極群丨〇〇及〗〇1之各電極,-各個之 ς =4係其一端與各電極之一端接觸’其另一端連接於多 轉換:、5。X,本實施形態為,對各電極各別分配探針 各電1=極=00及電極群101各別分配1個探針,要檢查 向時,以手動,或以適當的裝f,使探針依次 各電極移動之構成也可以。 多路轉換器5係將各探針4之另一山 發生哭·! ^ ^ ^ m T ^ 鳊選擇性地連接於訊號 接Λ 器2’或GND當中之任何一個者,其連 褥換係以電月旬6為之。圖2将顧+夕於土土 路之圖。 係颍不夕路轉換器5之内部電 J J ’就檢查裝置Α之檢查方法說明 。 耳先’電腦6選擇要檢杳斷繞夕蕾& 上 電極1 0 1 a v 、,+ 一峤線之電極。在此,假定選擇 ⑻二。二個=直;叉於所選擇之電極 l〇〇a。 、擇1個電極。在此假定選擇電極 極“二路轉換器5之連接轉換,將連接於電 針連接於訊號發生器1,將連接於電極1〇〇a之The signal generator 1 is a signal that changes with time in accordance with the instructions of the computer 7. The degree (frequency) of electricity over time is, for example, A Page 12 \\ 312 \ 2d-code \ 90-03 \ 90100952.ptd 494232 V. Description of the invention (10) 50 0 kHz to 10 MHz is should. In addition, the generated signal is either rectangular wave-shaped DC or AC. In addition, the signal generator is independent of the instructions of the computer 7, and it is also possible for the signal generator to occur frequently. The signal processor 2 is a filter processing that removes noise, etc. from the voltage appearing in the electrode group, [00 or 10], and a process that amplifies the voltage potential. The oscilloscope 3 measures the voltage potential from the signal sent from the signal processor 2. The measurement result is sent to the computer 6. The probe 4 is individually assigned to each electrode of the electrode group 丨 〇〇 and 〇〇1,-each of the = 4 means that one end is in contact with one end of each electrode ', and the other end is connected to the multi-transformer: 5, 5. X. In this embodiment, the probes are individually assigned to each electrode, each electrode is 1 = pole = 00, and each electrode group is assigned to one probe. To check the direction, manually or with appropriate mounting f, make A configuration in which the probes sequentially move the electrodes may be used. The multiplexer 5 series will cry to the other side of each probe 4! ^ ^ ^ m T ^ 鳊 is selectively connected to any one of the signal connector Λ or 2 ′ or GND. Figure 2 shows Gu + Xiyu Tutu Road. The internal electric power J J of the night circuit converter 5 is described as to the inspection method of the inspection device A. Ear-first 'computer 6 selects the electrode to be checked for breaks around the lei & upper electrode 1 0 1 a v, + one wire. Here, it is assumed that the second is selected. Two = straight; cross over the selected electrode 100a. Select one electrode. It is assumed here that the connection between the electrode and the “two-way converter 5” is selected, the connection is connected to the pin to the signal generator 1, and the connection to the electrode 100a

Ptd 9〇1〇〇952 第13頁 板針4連接於訊號處理哭 接於GND時,可實彳^ f 该時,把其他之探針4全部連 甘; J貝仃更正確的檢查。 /、-人’訊號發生5| 1私&炫# 壓藉由多路轉換^ ^ ^時間變化之電壓,把該電 該時,電極100a為,葬由t ^ 於電極1〇1&。 靜電容量,相應供:於m電極i〇u垂直交叉之部分之 屮相—兩π / 、、、口於電極1 0 1 a之電壓而出現電壓。 2 _理 “ ^係藉由板針4及多路轉換器5,由訊號處理器 z處理,並由示波器3計測之。 ,腦6係判定以示波器3所計測之電壓為,是否在預定之 内,如果在預定之範圍内時,判定為電極1 〇 1 a未斷線 而=在預疋之範圍内時,則判定為電極丨〇丨a有斷線。 判定為電極1 0 1 a未斷線時,移行至其他電極而進行檢 θ 〇 在此’所謂預定之範圍為,用假的面板B,就預先斷線 之電極及未斷線之電極,以同樣的順序實行檢查,根據分 別所得之資料而決定之範圍者。 :般而言,在檢查對象之電極有發生斷線時,從與其垂 直交又之電極所得到之上述電壓之電平會下降。 因此,預先計測未發生斷線時之電壓電平,及發生斷線 時之電壓電平,將該等電壓電平間之值作為判定斷線 低限值者。 ^如上述,檢查裝置A為’將垂直交又於檢查對象電極之 電極作為感測器來利用之結果,更簡單地能夠實行斷線檢Ptd 9〇〇〇〇952 page 13 board pin 4 is connected to the signal processing cry When connected to GND, it can be achieved ^ f At this time, all other probes 4 are connected; J Bey more accurate inspection. / 、-人 ’Signal occurs 5 | 1 私 & 炫 # Press the voltage that changes with time ^ ^ ^ time to change the voltage. At this time, the electrode 100a is buried in the electrode 101. The electrostatic capacity is correspondingly provided: the phase at the portion where the m electrode iou intersects vertically—two π /, ,, and a voltage appearing at the electrode 1 0 a. 2 _ Management "^ is processed by the pin 4 and the multiplexer 5, processed by the signal processor z, and measured by the oscilloscope 3. The brain 6 determines whether the voltage measured by the oscilloscope 3 is at a predetermined level If it is within the predetermined range, it is determined that the electrode 1 〇1 a is not disconnected, and if it is within the pre-set range, it is determined that the electrode 丨 〇 丨 a is disconnected. It is determined that the electrode 1 0 1 a is not disconnected. When disconnected, move to other electrodes and perform inspection. Θ Here, the so-called “predetermined range” is to use the false panel B to perform pre-disconnected electrodes and non-disconnected electrodes in the same order. The range determined by the obtained data: Generally speaking, when the electrode to be inspected is disconnected, the level of the above-mentioned voltage obtained from the electrode perpendicular to it will decrease. Therefore, it is measured in advance that the disconnection does not occur. The voltage level when the line is disconnected and the voltage level when the disconnection occurs, and the value between these voltage levels is used as the lower limit for determining the disconnection. ^ As described above, the inspection device A is' will cross perpendicularly to the inspection object. The result of using the electrode as a sensor More simply be able to carry out the disconnection inspection

90100952.ptd90100952.ptd

494232 五、發明說明(12) 其次’在電極101a有發生斷線時,京尤要 之方法說明如下。 j ^疋忒位置 首先,以上述檢查之結果’知道電極1〇la中 (探針4側)至電極100a為止之間有發生斷線的關係、,/以多 器2轉換裔5 ’代替電極1〇〇&而把電極義連接於訊號處理 然後,判定出現在電極1〇〇b之電壓是否在預定之範圍内 。如果在預定之範圍時,在自電極1〇la之一端至電極1〇〇 b為止之間,電極l〇la未發生斷線,因此,在電極1〇〇&盥 電極10 Ob之間發生斷線者。 如果不在預定之範圍内時,可以考量在自電極i〇ia之一 端至電極100b為止之間,t#1〇la有發生斷線的關係,用 多路轉換器5,代替電極i00b,將電極1〇〇c連接於訊號處 理器2。 以下,重復同樣的方法之結果,可找出電極丨〇丨a之斷線 之部分。例如,在圖1之X點有發生斷線時,以電極丨〇〇b與 電極10 0c之間為境界而出現在電極之電壓會發生變化。 對電極群1 0 0及1 0 1之全部電極實行上述方法之結果,可 完成板面B之斷線檢查。使/ 線部位的關係,其修理也方 又’上述檢查方法為》在 ,什測在離開電極1 0 1 a之' 100a所出現之電壓。此乃因 之略全部部分之斷線的關係 丨該檢查方法時,可明白斷 便。 檢查電極1 0 1 a之斷線時,最初 端(探針4侧)最遠位置之電極 以一次的檢查來檢查電極丨〇 i a 。然而,例如,容易斷線的494232 V. Description of the invention (12) Secondly, when the electrode 101a is disconnected, the method described by Jingyou is as follows. j ^ 疋 忒 Position First, based on the results of the above inspection, 'know that there is a disconnection relationship between electrode 10a (probe 4 side) and electrode 100a, 1 00 & while the electrode is connected to the signal processing, then it is determined whether the voltage appearing at the electrode 100b is within a predetermined range. If it is within a predetermined range, the electrode 10a is not disconnected from one end of the electrode 10a to the electrode 100b. Therefore, it occurs between the electrode 100 and the electrode 10 Ob. Disconnector. If it is not within the predetermined range, it can be considered that from the end of the electrode i0ia to the electrode 100b, t # 1〇la has a disconnection relationship. Use a multiplexer 5 instead of the electrode i00b to connect the electrode 100c is connected to the signal processor 2. Hereinafter, the result of the same method is repeated to find the part where the electrode 丨 〇 丨 a is broken. For example, when a disconnection occurs at point X in FIG. 1, the voltage appearing on the electrode will change with the boundary between the electrode 100b and the electrode 100c as the boundary. As a result of performing the above method on all the electrodes of the electrode groups 100 and 101, the disconnection inspection of the plate surface B can be completed. The relationship between the line and the line can also be repaired. The above-mentioned inspection method is "on", and even the voltage appearing at 100a away from the electrode 1 0 1 a. This is because of the relationship between broken lines in almost all parts. 丨 When checking the method, you can understand the break. When the electrode 1 0 a is disconnected, the electrode at the furthest end of the initial end (probe 4 side) is inspected with one inspection. However, for example,

494232 五、發明說明(13) 場所等為只限於某一部分等時, 1 0 0 c所出現之電壓也可以。該時σ,· ^不是離開最遠的電極 一端至電極100C為止之間之者可以檢查自電極1 Ola之 又,上述檢查方法為,將探針4 而把隨著時間變化之電壓供給於 Y於電極l〇la之一端 針4之位置並非限定於此,可能 ° 〇la,然而,接觸探 任何部分而供給也可。 活,接觸於電極101a之 又,上述檢查方法為,從與檢查董^ ^ ^ ^ ^ ^ ^ ^ ^ ^ 叉之電極群1 0 0當中選擇一個電極不之電極1 0 1 a垂直父 l〇〇a之電壓與預先決定之範圍*較來判斷==二電極 現=耸從電極群1〇°當中選擇複數個電極,互疋相比 車乂出現在该專之電壓之結果,來 為如果電極= = = = 以極ΐ電壓會相異的關係。例如,在圖1之X點有發ί 斷=,出現在電極10〇a與電極1〇()b之電壓為略同樣 二^出現在其他的電極,例如電極1〇〇c之 同的電平者。 1曰”具不 j用該方法日夺,其優點為’可節省計測上述「預先決定 ^」之作業及時間以外,可知電極有無斷線之同時可 別指定斷線部位者。 夺寸 ^ ’該時,計測與檢查對象之電極(電極丨〇丨a )垂直交又 之,極群(電極群1〇〇)之全部之電極出現之電壓也可,戋 考里可能會斷線之範圍而就該垂直交叉之電極群之一部八 電極只行叶測也可以。又,在該垂直交叉之電極群之電極 1 90100952.ptd 第16頁 494232 五、發明說明(14) 當中,跳過一個,或跳過兩個之手法,對適當間隔之電極 實行計測也可以。 [產業上之利用可能性] 如上述,根據本發明,可簡單地檢查電極之斷線。 [元件編號之說明] 1 訊號發生器 2 訊號處理器 3 示波器 4 探針 5 多路轉換器 6 電腦 7 電腦 100,10 1 電極群494232 V. Description of the invention (13) When the place is limited to a certain part, etc., the voltage appearing at 1 0 0 c is also acceptable. At this time, σ, · ^ is not the one farthest from the electrode end to the electrode 100C can be inspected from the electrode 1 Ola. The above inspection method is to supply the probe 4 and the voltage that changes with time to Y The position of the end pin 4 on one of the electrodes 101a is not limited to this, and may be θla, however, it may be supplied by touching any part. Live, contact the electrode 101a, and the above inspection method is to select an electrode 1 0 1 a that is not an electrode 1 0 1 a perpendicular to the parent from the inspection group ^ ^ ^ ^ ^ ^ ^ ^ ^ The voltage of 〇a is determined in accordance with a predetermined range. == Two-electrode is now = select a plurality of electrodes from the electrode group 10 °, compared to the result of the voltage appearing in the special car compared with each other, if Electrode = = = = The relationship will be different depending on the voltage. For example, there is a break at point X in Figure 1. The voltage appearing at electrode 10a and electrode 10 () b is slightly the same. It appears at other electrodes, such as the same voltage as electrode 100c. Flat. "Yi" means that you can use this method to win the day. The advantage is that you can save the work and time of measuring the "predetermined ^" mentioned above, and you can know whether the electrode is disconnected and you can specify the disconnection location. ^^ At this time, the measurement and the electrode of inspection (electrode 丨 〇 丨 a) are perpendicular to each other, and the voltage appearing in all the electrodes of the pole group (electrode group 100) is also acceptable. The range of the line and only the eight electrodes of the electrode group that intersects vertically may be measured by leaf. In the electrode group of the vertically intersecting electrode group 1 90100952.ptd page 16 494232 5. In the description of the invention (14), skip one method or two methods, and it is also possible to measure the electrodes at appropriate intervals. [Industrial Applicability] As described above, according to the present invention, the disconnection of the electrode can be easily checked. [Explanation of component number] 1 signal generator 2 signal processor 3 oscilloscope 4 probe 5 multiplexer 6 computer 7 computer 100,10 1 electrode group

90100952.ptd 第17頁 49423290100952.ptd Page 17 494232

90100952.ptd 第18頁90100952.ptd Page 18

Claims (1)

494232 六、申請專利範圍 1. 一種單純矩陣型液晶面板之檢查方法,其係用以檢查 單純矩陣型液晶面板所具有之複數條電極之斷線者,其特 徵為,包含有: 選擇前述電極中之任何一條電極,對所選擇之電極之一 端供給隨著時間變化之電壓的步驟; 就與前述所選擇之電極垂直交叉之複數條前述電極中之 任何一條電極,計測因供給前述電壓之結果所出現之電壓 的計測步驟;以及 根據前述所計測之電壓是否在預定之範圍内,來判斷前 述選擇之電極在自前述一端至前述計測步驟中所計測電壓 之前述電極為止之間的部分,是否有發生斷線的判斷步 驟。 2 ·如申請專利範圍第1項之單純矩陣型液晶面板之檢查 方法,其中,在前述計測步驟中,於垂直交叉於前述所選 擇之電極之複數條前述電極當中,就離開前述選擇之電極 之一端最遠位置之電極,計測前述電壓者。 3.如申請專利範圍第1或2項之單純矩陣型液晶面板之檢 查方法,其中,在前述判斷步驟中,當判斷前述電極有發 生斷線時,包含有: 在與前述所選擇之電極垂直交叉之複數條前述電極當中 ,就位於比在前述計測步驟中計測電壓之前述電極更靠近 前述一端側位置之各電極,依次計測因供給前述電壓之結 果所出現之電壓之步驟;以及 特別指定前述所計測之電壓在預定範圍内之電極,藉以494232 VI. Scope of patent application 1. A method for inspecting a simple matrix liquid crystal panel, which is used to inspect the disconnection of a plurality of electrodes of a simple matrix liquid crystal panel, which is characterized by: A step of supplying a voltage that changes with time to one end of the selected electrode; and for any one of the plurality of electrodes that vertically intersects the selected electrode, measure the result of supplying the voltage The step of measuring the voltage that appears; and whether the portion of the selected electrode is from the one end to the electrode of the voltage measured in the measurement step is determined based on whether the voltage measured is within a predetermined range. Steps to determine if a disconnection occurred. 2 · If the method for inspecting a simple matrix liquid crystal panel according to item 1 of the scope of the patent application, in the aforementioned measuring step, among the plurality of aforementioned electrodes perpendicularly crossing the aforementioned selected electrodes, leave the aforementioned selected electrodes. For the electrode at the farthest end, measure the aforementioned voltage. 3. The method for inspecting a simple matrix liquid crystal panel according to item 1 or 2 of the scope of patent application, wherein in the foregoing determination step, when it is determined that the electrode is disconnected, it includes: perpendicular to the selected electrode Among the plurality of electrodes intersecting, each electrode located closer to the one end side than the electrode for measuring the voltage in the foregoing measuring step is a step of sequentially measuring a voltage appearing as a result of supplying the voltage; and specifically specifying the foregoing An electrode whose measured voltage is within a predetermined range, whereby \\312\2d-code\90-03\90100952.ptd 第19頁 、'申請專利範圍 特4別指定?述選擇之電極之斷線部位之步驟。 no 種單純矩陣型液晶面板之檢查方, 早純矩陣型液晶面板所且有 /、糸用以檢杳 徵為包含有:氣、有之稷數條電極之辦線者,其; 八璉擇前述電極當中之任一電極,對 刀供給隨著時間而變化之電壓之步驟·、 〃極之一部 就與前述所選擇之電極垂直交又A游 之任一雷搞,y、目丨η 後數條則述雷;K A %、 電極什測因供給前述電壓之社果所ψ ^冤極當中 叶剛步驟;以及 °果所出現之電壓之 根據前述計測之電壓是々 選擇之電極在自前述一部分至前、求^圍内,判斷前述所 珂述電極為止之間的部Α :’貝’步驟中計測電壓之 5· -種單純矩陣“:面斷線的判 早純矩陣型液晶面板一法,其係用以檢杳 徵為包含有: 反所具有之祓數條電極之斷線者,其^ 選擇前述電極當中之一 … 著時間而變化之電壓的步驟電極,對所選擇之電極供給隨 就與前述所選擇之雷二二二> 測因供給前述電壓之社里^ 父叉之複數條前述電極,計 互相比較根據前述$斗所出現之電壓的計測步驟;以及 之電極是否有發生斷绩:測之各電壓來判斷前述所選擇 ,,^ ^ 4線的判斷步驟者。 6 ·如申請專利範園第 口口 方法,其中,前述計牛、η之單純矩陣型液晶面板之檢查 直交叉之電極當中,驟為’在與前述所選擇之電極垂 匕含在可料想有斷線之區域中之前\\ 312 \ 2d-code \ 90-03 \ 90100952.ptd page 19, 'Scope of patent application, especially 4 designation? The steps of selecting the disconnected part of the electrode are described. The inspection method of no simple matrix type LCD panel, the early pure matrix type LCD panel has /, and is used to detect the signs that include: gas, there are several electrodes of the line operator, which; For any one of the foregoing electrodes, the step of supplying a voltage that changes with time to the knife, one of the electrodes is perpendicular to the selected electrode, and any one of the A-three electrodes is engaged. The last few paragraphs describe mines; KA%, the electrode is measured because of the middle voltage step of the society that supplies the aforementioned voltage; and the voltage that appears according to the foregoing measurement is the voltage of the selected electrode Determine the part A between the previous part and the front part, and determine the voltage between the electrodes mentioned above: A: 5 kinds of simple matrix of the measured voltage in the step of "shell": early-pure-matrix type liquid crystal panel for judging a broken line A method which is used to detect the signs that include: the disconnection of a plurality of electrodes that are opposite to one another, which ^ select one of the aforementioned electrodes ... a step electrode that changes the voltage with time, and The electrode supply is then selected as before Lei 222 > Measure the multiple steps of the aforementioned electrodes in the company that supplied the aforementioned voltage ^ Compare the measurement steps of the voltages appearing according to the aforementioned $ dou; and whether the electrodes have broken performance: each of the measured Voltage to judge the selected step of the above, ^ ^ 4 lines. 6 · For example, in the patent application Fanyuan mouth method, in which the above-mentioned pure matrix type LCD panel that counts cattle and η is checked among the electrodes that cross straight, The step is' before the electrode with the selected electrode is included in the area where the disconnection is expected. W312\2d-code\90-03\90100952.ptd 第20頁 、、:申請專利範圍 述電極,可計 7 J則述電壓者。 &,其中月專:以、匕項之單純矩陣型液晶面板之檢查 直广又之全部電極:十:步,為’就與前述所選擇之電極垂 8·如申士主s心 。十测前述電壓者。 面板之认=專利範圍第5至7項中任一項夕抑从 之杈查方法,罝 、 員之早純矩陣型液晶 別述所選擇之^ ,可包含有判斷為在前述判斷步驟 在前述所計測Γ有發生斷線時, :述電極之結*當中二特別指定該電壓有變化之 步驟者。 別指定前述選擇之電極之斷線部位 示面柘種電漿顯示面板之檢杳方法盆 具有之複數 ::其:用以檢查電漿顯 佴=擇别述電極當中之任—雷=線者其特徵為包含有: 就與ί::;:::壓的步驟,•…之-端 極,計測因供ϊ,ίΐίΐϊΐ條前述電極當中 。十剩步驟;以Α 迷電昼之結果所出現之電壓的 根據前述計測之雷厭B 選擇之電極在自前述之範圍a,判斷前述所 述極為止之間之部,====中計測m2 10. -種電漿顯示面板之;”】斷步驟。 頌示面板所具有之複數—法,/、係用以檢杳 含有· 反双條之電極之斷線者,甘& —电水 遠擇前述電極當中之杯― 任一電極,對所選擇 〜%極之W312 \ 2d-code \ 90-03 \ 90100952.ptd Page 20 ,: Patent application scope For electrodes, 7 J can be counted for voltage. & Among them: Month: Inspection of simple matrix type LCD panels with daggers and straight electrodes. All the electrodes: Ten: Steps, ’will be perpendicular to the electrode selected above. Ten test the aforementioned voltage. Panel recognition = any one of the 5th to 7th patents in the patent range, the method of searching, and the early selection of the pure matrix matrix liquid crystal, ^, which can be included in the judgment step When there is a disconnection in the measured Γ, two of the electrode junctions mentioned above specify the step in which the voltage changes. Do not specify the method of detecting the plasma display panel of the disconnected part of the electrode selected above. There are multiple types of pots :: It is used to check the plasma display. = Choose any of the electrodes described above-thunder = line. Its characteristics are as follows: the step of pressing with ί ::; :::, the…-end pole, which is measured among the aforementioned electrodes. Ten steps; the voltage selected according to the foregoing measurement of the lightning resistance B that appears as the result of the day of ΔMedium, and the electrode selected according to the foregoing measurement, is judged from the foregoing range a, and the portion between the foregoing electrodes is measured, ==== m2 10.-A kind of plasma display panel; "] breaking step. The plural of the chanting panel-method, /, is used to detect the disconnection of electrodes containing · anti-double stripe, Gan & Water selects the cup among the aforementioned electrodes-any electrode, for the selected ~% electrode 9〇1〇〇952.ptd 第21頁 • 具特徵為包 494232 六、申請專利範圍 分供給隨著時間而變化之電壓的步驟; κ 就與前述所選擇之電極垂直交叉之複數條前述電極當中 -之任一電極,計測因供給前述電壓之結果所出現之電壓的 計測步驟;以及 根據前述所計測之電壓是否在預定之範圍内,判斷前述 所選擇之電極在自前述一部分至前述計測步驟中計測電壓 之前述電極為止之間之部分,是否發生斷線的判斷步驟。 1 1. 一種電漿顯示面板之檢查方法,其係用以檢查電漿 顯示面板所具有之複數條之電極之斷線者,其其特徵為包 含有: / 選擇前述電極當中之任一電極,對所選擇之電極供給隨 、 著時間而變化之電壓的步驟; 就與前述所選擇之電極垂直交叉之複數條前述電極,分 別計測因供給前述電壓之結果所出現之電壓的計測步驟; 以及 將前述所計測之各電壓互相比較之結果,判斷前述所選 擇之電極是否有斷線的判斷步驟。 1 2. —種單純矩陣型液晶面板之檢查裝置,其係用以檢 查單純矩陣型液晶面板所具有之複數條之電極之斷線者, 其特徵為具備有: _ 從前述電極當中所選擇之一條前述電極之一端,供給 隨著時間而變化之電壓的機構; 就與前述所選擇之電極垂直交叉之複數條前述電極當 中之任一電極,計測因供給前述電壓之結果所出現之電9〇〇〇952.ptd page 21 • Features package 494232 VI. Patent application step of supplying voltage that changes with time; κ Among the plurality of aforementioned electrodes that intersect perpendicularly with the previously selected electrodes Any one of the electrodes, a measurement step for measuring a voltage appearing as a result of supplying the foregoing voltage; and determining whether the selected electrode is in the range from the foregoing part to the foregoing measurement step based on whether the foregoing measured voltage is within a predetermined range The step of judging whether a disconnection occurs in the part between the electrodes to which the voltage is measured. 1 1. An inspection method for a plasma display panel, which is used to inspect the disconnection of a plurality of electrodes of the plasma display panel, which is characterized by: / selecting any one of the foregoing electrodes, A step of supplying a selected electrode with a voltage that changes with time; a measurement step of measuring a voltage appearing as a result of supplying the voltage to each of the plurality of the electrodes perpendicularly crossing the selected electrode; and As a result of comparing the measured voltages with each other, a determination step is performed to determine whether the selected electrode has a disconnection. 1 2. —A simple matrix type liquid crystal panel inspection device, which is used to check the disconnection of a plurality of electrodes of a simple matrix type liquid crystal panel, which is characterized by having: _ one selected from the foregoing electrodes A mechanism for supplying a voltage that changes with time at one end of one of the foregoing electrodes; for any one of the plurality of foregoing electrodes that intersects the selected electrode perpendicularly, measures the electricity appearing as a result of supplying the foregoing voltage \\312\2d-code\90-03\90100952.ptd 第22頁 甲請專利範圍 屢的計測機構;以及 所選J否在f定,範圍内,判斷前述 前述電極為止之間二^ f 述计測機構計測電塵之 13.如申請專利i /;;9,疋否發生斷線的判斷機構。 查裝置,i Φ二圍弟2項之單純矩陣型液晶面板之产 直交Ht,刖述計測機構,係與前述所選擇之f 位數電極# I最㈣前述所 罝的包極,以計測前述電壓者。 之^ ^12,tl3 # „ ,Ε ρ, ^ ^ βΘθ ^ 辦線日; “ ’當前述判斷機構判斷前述電極有發生 二n則機才冓具備有進行以下作t之機構, ,二、人丽述所選擇之電極垂直交叉之複數之 “ ::於比先計測電壓之前述電 :二::: ;各電極,依次計測因供給前述電壓之後“現=置 以“::$所計測之電壓在預定之範圍内之電極,, ^別^日疋則述所選擇之電極之斷線部位。猎 查單純一矩種陣單型= 特徵為具備有曰曰面板所具有之複數條電極之斷線者,其 —對從前述電極當中所選擇之任一 者時間而變化之電壓的機構;。“ ’供、給隨 就與別述所選擇之電極垂直交叉之複數條前述電極當中 、申請專利範圍 之任一電極,計測因佴 ,、 計測機構;以及 、、'Q刖述電堅之結果所出現之電Γ 根據前述計測之電壓3 選擇之電極在自前述〜:否在預疋之範圍Θ,判斷前 述電極為止之間之部分^至^料測機構計測電壓= 1 6. —種單純矩陣型疋否叙生斷線的判斷機構。別 查單純矩陣型、夜曰而/夜晶面板之檢查裝置,盆俜用 特徵為具備有: 斤,、有之稷數條電極之斷線者双 4kl , 可’其 六 對從前述電極當中所 " 變化之電壓的機構;^之壬-電極’供給隨著時間而 就舆前述所選擇之電 Π測因供給前述電壓a果;出,分 以及 纥的^ ^機構· J相比較前述分別計測之電壓之結果 之电極是否發生斷線的判斷機構。 斬刖述所選擇 1 7 ·如申明專利範圍第丨6項之單純矩陣型液曰 :裝置,㊣中,前述計測機構係就與前述選曰曰反之檢 父叉之電極當中,包含在可料想斷線之區域 f極垂直 ’以計測前述電壓者。 &則述電極 1 8·如申請專利範圍第丨6項之單純矩陣型液曰 查裝置,其中,前述計測機構係就與前述選擇 反之檢 父叉之全部電極,以計測前述電壓者。 ,'亟垂直 1 9.如申請專利範圍第丨6至丨8項中任一 _ α 〜平純矩陳刑 液曰曰面板之檢查裝置,其中,當前述判斷機構判斷為前尘述\\ 312 \ 2d-code \ 90-03 \ 90100952.ptd Page 22 A Patented measuring mechanism with repeated patent scopes; and whether the selected J is within the range of f, and the range between the aforementioned electrodes is determined ^ f f 13. Measuring mechanism for measuring electric dust 13. If applying for a patent i / ;; 9, judging mechanism of whether a disconnection occurs. Check the device, i Φ 2 si 2 of the simple matrix type liquid crystal panel produced orthogonal Ht, the measurement mechanism is the same as the selected f-digit electrode # I, the above-mentioned envelope, in order to measure the aforementioned Voltage person. ^ ^ 12 , tl3 # „, Ε ρ, ^ ^ βΘθ ^ Date of operation;" 'When the aforementioned judging mechanism judges that the aforementioned electrode has occurred, there are two mechanisms, and there is a mechanism for performing the following actions: The plural of the electrodes that Li Shu selected vertically intersected ":: The above-mentioned electricity that measures the voltage before the first: two :::; each electrode, in order to measure after the supply of the aforementioned voltage" now = set with ":: $ measured by For electrodes with a voltage within a predetermined range, ^ Don't ^ Sundial describes the disconnection position of the selected electrode. Hunting simple single-moment array single type = characterized by having a plurality of electrodes on the panel The disconnector is a mechanism that changes the voltage of any one of the aforementioned electrodes from time to time; "'supply and supply among the plurality of aforementioned electrodes that perpendicularly intersect with the other selected electrodes, apply Any of the electrodes in the patent scope, the measuring mechanism, and the measuring mechanism; and, the electric power appearing as a result of the electric strength described in the above Q. The electrode selected according to the aforementioned measured voltage 3 is from the foregoing ~: Is it in advance? Range Θ, judge the aforementioned electrode The measurement voltage between the materials ^ and ^ is equal to 1 6. —A simple matrix type judgment mechanism for whether or not a broken wire is generated. Don't check the simple matrix type, night / night crystal panel inspection device. The characteristics of the basin are as follows: There are two wires of 4kl for the disconnection of several electrodes, and six of them can be selected from the foregoing electrodes. The "changing voltage mechanism" means that the "non-electrode" supply is based on the above-mentioned selected electric power over time, and the above-mentioned voltage is supplied; the results, points, and the ^ ^ mechanism are compared with the above. A mechanism for judging whether the electrodes are disconnected as a result of the voltages measured separately. Choosing the choice 17 • As stated in the patent claim No. 6 of the simple matrix type liquid device: device, the aforementioned measurement mechanism is in contrast to the previously selected electrode of the father fork, which is included in the expected The disconnected area f is extremely vertical to measure the aforementioned voltage. & The electrodes 18. As in the simple matrix type liquid inspection device of item 6 of the patent application scope, wherein the aforementioned measuring mechanism is the opposite of the aforementioned selection, all the electrodes of the parent fork are used to measure the aforementioned voltage. , 'Urgent vertical 1 9. As in any of the patent application scope items 丨 6 to 丨 8 _ α ~ Pingchun moment Chen Xing liquid inspection panel inspection device, wherein when the foregoing judgment mechanism judges it to 六、申請專利範圍 所:3 ί電極有斷線時具備有: 前述電極之ί:壓當中,特別指定’ 部位的機構;果’"夠特別指定前迷選;有變化之 2〇.-種電漿顯示面板之柃 5之斷線 $示面板所具有之複數 :-4置,其係用 有: 條電極之辦線者,装:撿查電漿 選擇前述電極中之任…徵為具備 供給隨著時間而變化之電所選擇之電極… 就與前述所選遥夕的機構; 铋, 之任-電極,計測因之複數條前述電 計測機,;以及 述電廢之結果所出現之電】: 所選擇之壓是否在預定之範圍内、 述電極為止之間之:前述計測機構計測電::; 顯2」.面—广電漿顯示面板之:二置斷線直:, 顯不面板所具有之複數-衣置,其係用以檢查電漿 有·· 條電極之斷線者,其特徵為包含 遠擇前述電極中之— ,供給隨著時間而二電極,對所選擇之電極之一部八 j 與,所^ 之任一電*,計測因=之硬數條前述電極當中 計測機構;以及、、,。别述電屋之結果所出現之電壓的 根據前述計測 〗之電麼疋否在預定之範圍内,判斷前述所 90100952.ptd 第25頁 494232 六、申請專利範圍 選擇之電極為,在自前述一部分至前述計測機構計測電壓 之前述電極為止之間之部分,是否發生斷線的判斷機構。 2 2. —種電漿顯示面板之檢查裝置,其係用以檢查電漿 顯示面板所具有之複數條電極之斷線用之檢查裝置,其特 徵為包含有: 選擇前述電極中之任一電極,對所選擇之電極供給隨著 時間而變化之電壓的機構; 就與前述所選擇之電極垂直交叉之複數條前述電極分別 計測因供給前述電壓之結果所出現之電壓的計測機構;以 及 互相比較根據前述所計測之各電壓之結果,判斷前述所 選擇之電極為是否發生斷線的判斷機構。6. Scope of the patent application: 3 ί When the electrode is broken, it is equipped with: The above electrode: lie in the middle of the electrode, specially designated the 'part of the mechanism; the fruit' " enough to specifically specify the former fan election; there are changes of 20 ..- This type of plasma display panel has 5 broken lines. The display panel has a plurality of: -4, which is used to: line electrode organizer, equipment: check the plasma to select any of the aforementioned electrodes ... Equipped with the electrodes selected to supply electricity that changes with time ... the same mechanism as the previously selected remotely; bismuth, any of the electrodes, measuring the multiple electric measuring machines described above, and the results of the electric waste appear [Electricity]: Whether the selected voltage is within a predetermined range and between the above electrodes: The aforementioned measuring mechanism measures electricity ::; 2 ”. Surface-Radio and television plasma display panel: two break lines straight :, The display panel has a plurality of clothes, which are used to check the disconnection of the electrodes of the plasma. It is characterized by including one of the aforementioned electrodes, which provides two electrodes with time. Any one of the selected electrodes and any of the electricity * = Measured by the number of the hard electrode which measuring means; and ,,,. Regarding the voltage appearing in the result of the electric house, whether the electricity according to the foregoing measurement is not within a predetermined range, and judge whether the above-mentioned 90100952.ptd page 25 494232 VI. The electrode selected for the scope of patent application is, A mechanism for judging whether or not a disconnection occurs in a portion between the aforementioned electrodes for measuring the voltage by the aforementioned measuring mechanism. 2 2. An inspection device for a plasma display panel, which is an inspection device for inspecting the disconnection of a plurality of electrodes of the plasma display panel, and is characterized by including: selecting any one of the foregoing electrodes A mechanism for supplying a voltage that changes with time to the selected electrode; a measuring mechanism for measuring the voltage appearing as a result of supplying the voltage to each of the plurality of the electrodes perpendicularly crossing the selected electrode; and comparing each other Based on the results of the measured voltages, the selected electrode is a judging mechanism for determining whether a disconnection has occurred. \\312\2d-code\90-03\90100952.ptd 第26頁\\ 312 \ 2d-code \ 90-03 \ 90100952.ptd Page 26
TW90100952A 2000-01-18 2001-01-16 Method and apparatus for inspecting simple-matrix type liquid crystal panel, and method and apparatus for inspecting plasma display panel TW494232B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000009287A JP2001201753A (en) 2000-01-18 2000-01-18 Method and instrument for inspecting simple matrix type liquid crystal panel, method and instrument for inspecting plasma display panel

Publications (1)

Publication Number Publication Date
TW494232B true TW494232B (en) 2002-07-11

Family

ID=18537457

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90100952A TW494232B (en) 2000-01-18 2001-01-16 Method and apparatus for inspecting simple-matrix type liquid crystal panel, and method and apparatus for inspecting plasma display panel

Country Status (3)

Country Link
JP (1) JP2001201753A (en)
TW (1) TW494232B (en)
WO (1) WO2001053842A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4653775B2 (en) * 2002-04-26 2011-03-16 東芝モバイルディスプレイ株式会社 Inspection method for EL display device
EP1486791B1 (en) * 2003-06-11 2008-07-30 Infineon Technologies AG Semiconductor chip, comprising a monitoring device, which can be used to monitor whether the semiconductor chip is mechanically damaged
US7631230B2 (en) * 2004-11-19 2009-12-08 Sun Microsystems, Inc. Method and apparatus for testing a transmission path
US7514937B2 (en) 2005-11-21 2009-04-07 Sun Microsystems, Inc. Method and apparatus for interconnect diagnosis
US7394260B2 (en) 2006-05-24 2008-07-01 Sun Microsystems, Inc. Tuning a test trace configured for capacitive coupling to signal traces
CN101799508B (en) * 2010-03-09 2012-06-13 上海松下等离子显示器有限公司 Wire break detection method of electrode
JP5671316B2 (en) * 2010-12-01 2015-02-18 株式会社Ihi Space floating object detection device
JPWO2021079945A1 (en) * 2019-10-25 2021-04-29

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS559146A (en) * 1978-07-06 1980-01-23 Pentel Kk Tablet testing device
JPH07146323A (en) * 1993-11-22 1995-06-06 Inter Tec:Kk Method and device for inspecting glass substrate for liquid crystal display
JP3359732B2 (en) * 1994-03-29 2002-12-24 大日本印刷株式会社 Defect detection method and defect detection device for linear electrode
KR100213603B1 (en) * 1994-12-28 1999-08-02 가나이 쯔또무 Wiring correcting method and its device of electronic circuit substrate, and electronic circuit substrate

Also Published As

Publication number Publication date
JP2001201753A (en) 2001-07-27
WO2001053842A1 (en) 2001-07-26

Similar Documents

Publication Publication Date Title
TWI345060B (en) Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same
TW209317B (en)
KR100796171B1 (en) Contact type single side probe and inspection apparatus and method for open/short test of conductive lines used thereof
TW494232B (en) Method and apparatus for inspecting simple-matrix type liquid crystal panel, and method and apparatus for inspecting plasma display panel
CN108511419B (en) Semiconductor devices
TWI287097B (en) Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium
TW201032942A (en) Method for inspecting electrostatic chuck, and electrostatic chuck apparatus
TW200842639A (en) Contact mechanism cleaning
CN104749478B (en) Crimp test circuit and test method and its application
CN101023317A (en) Inspection apparatus, inspection method and sensor for inspection apparatus
CN209071280U (en) The detection device of wafer
JP2011060021A (en) Inspection device, inspection method and inspection sheet for capacitance type touch panel
US20030122558A1 (en) System and method for measuring photovoltaic cell conductive layer quality and net resistance
CN103837809B (en) The IC layout of test MOSFET matching and method of testing
CN107703361A (en) A kind of measurable FOF of whole Bonding regions impedance
CN103424629B (en) A kind of simple and easy method testing impedance of graphene oxide solution
WO2004057350A1 (en) Circuit pattern inspection instrument and pattern inspecting method
CN108122796A (en) It is bonded the detecting system of damage
CN104952750B (en) The early stage detecting system and method for a kind of silicon chip electrical testing
CN109597251A (en) LCD binds pin configuration, glass substrate and modular structure
Rachevskaia et al. Test and quality control of double-sided silicon microstrip sensors for the ALICE experiment
CN101499458B (en) Test structure and method for detecting disc trap and corrosion caused by CMP
CN109997046A (en) Electric resistance measuring apparatus and resistance measurement method
CN107248499B (en) Static release device and manufacturing method, focused ion beam equipment and application method
CN207764365U (en) Inductor off position detection device

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees