JPWO2022029862A1 - - Google Patents

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Publication number
JPWO2022029862A1
JPWO2022029862A1 JP2022509170A JP2022509170A JPWO2022029862A1 JP WO2022029862 A1 JPWO2022029862 A1 JP WO2022029862A1 JP 2022509170 A JP2022509170 A JP 2022509170A JP 2022509170 A JP2022509170 A JP 2022509170A JP WO2022029862 A1 JPWO2022029862 A1 JP WO2022029862A1
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JP
Japan
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JP2022509170A
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JP7198389B2 (ja
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/28Electrolytic cell components
    • G01N27/30Electrodes, e.g. test electrodes; Half-cells
    • G01N27/305Electrodes, e.g. test electrodes; Half-cells optically transparent or photoresponsive electrodes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/28Electrolytic cell components
    • G01N27/30Electrodes, e.g. test electrodes; Half-cells
    • G01N27/308Electrodes, e.g. test electrodes; Half-cells at least partially made of carbon

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP2022509170A 2020-08-04 2020-08-04 電極評価方法 Active JP7198389B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/029743 WO2022029862A1 (ja) 2020-08-04 2020-08-04 電極評価方法

Publications (2)

Publication Number Publication Date
JPWO2022029862A1 true JPWO2022029862A1 (ja) 2022-02-10
JP7198389B2 JP7198389B2 (ja) 2022-12-28

Family

ID=80117866

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022509170A Active JP7198389B2 (ja) 2020-08-04 2020-08-04 電極評価方法

Country Status (4)

Country Link
US (1) US20220170871A1 (ja)
JP (1) JP7198389B2 (ja)
CN (1) CN114303064A (ja)
WO (1) WO2022029862A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117074487B (zh) * 2023-10-16 2023-12-26 深圳豪威显示科技有限公司 光电性能检测分析设备和方法

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JP2006349387A (ja) * 2005-06-13 2006-12-28 Tdk Corp 金属薄膜の腐食速度解析方法
US20110236769A1 (en) * 2010-03-23 2011-09-29 Xing Xie Three dimensional electrodes useful for microbial fuel cells
JP2016004836A (ja) * 2014-06-13 2016-01-12 日本ゼオン株式会社 色素増感型太陽電池用導電性フィルム、色素増感型太陽電池用電極、色素増感型太陽電池および太陽電池モジュール
WO2016013478A1 (ja) * 2014-07-22 2016-01-28 東洋紡株式会社 薄膜積層フィルム
JP2018514060A (ja) * 2015-04-03 2018-05-31 シー3ナノ・インコーポレイテッドC3Nano Inc. 貴金属被覆銀ナノワイヤー、コーティングを行うための方法および安定化透明導電性フィルム
WO2020054018A1 (ja) * 2018-09-13 2020-03-19 株式会社 東芝 グラフェン含有膜の陰イオン透過性評価方法および光電変換素子
JP2020041982A (ja) * 2018-09-13 2020-03-19 株式会社東芝 膜状構造体の陰イオン透過性評価方法および電気化学素子

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JP3013667B2 (ja) * 1993-10-12 2000-02-28 富士電機株式会社 薄膜の表面状態の評価方法
US5764401A (en) * 1994-11-11 1998-06-09 Sony Corporation Optical apparatus
US5903382A (en) * 1997-12-19 1999-05-11 Rockwell International Corporation Electrodeposition cell with high light transmission
US6301039B1 (en) * 2000-09-13 2001-10-09 Rockwell Technologies, Llc Reversible electrochemical mirror (REM) state monitoring
JP2002267628A (ja) * 2001-03-09 2002-09-18 Osaka Gas Co Ltd 電気化学測定方法および装置
WO2004024394A1 (en) * 2002-09-16 2004-03-25 Applied Materials, Inc. Control of removal profile in electrochemically assisted cmp
US6721080B1 (en) * 2002-09-27 2004-04-13 D Morgan Tench Optimum switching of a reversible electrochemical mirror device
JP5744401B2 (ja) * 2006-04-24 2015-07-08 カプレス・アクティーゼルスカブCapres A/S 浅い半導体注入のシート抵抗およびリーク電流密度の測定方法
JP5651910B2 (ja) * 2007-12-13 2015-01-14 コニカミノルタ株式会社 透明導電膜、及び透明導電膜の製造方法
JP2009164115A (ja) * 2007-12-14 2009-07-23 Panasonic Corp 電極材料の評価方法、電極の製造方法および電極の製造装置
WO2011077755A1 (ja) * 2009-12-25 2011-06-30 トヨタ自動車株式会社 燃料電池用セパレータおよびその製造方法
JP5646424B2 (ja) * 2011-09-27 2014-12-24 株式会社東芝 透明電極積層体
JP5583097B2 (ja) * 2011-09-27 2014-09-03 株式会社東芝 透明電極積層体
WO2013122131A1 (ja) * 2012-02-15 2013-08-22 コニカミノルタ株式会社 透明電極および電子デバイス
KR101324430B1 (ko) * 2012-02-20 2013-10-31 충북대학교 산학협력단 직선형 광원을 이용한 비접촉식 저항 측정 장치 및 방법
WO2013161603A1 (ja) * 2012-04-24 2013-10-31 コニカミノルタ株式会社 透明電極、電子デバイス、および透明電極の製造方法
WO2013173070A1 (en) * 2012-05-18 2013-11-21 3M Innovative Properties Company Corona patterning of overcoated nanowire transparent conducting coatings
JP6147542B2 (ja) * 2013-04-01 2017-06-14 株式会社東芝 透明導電フィルムおよび電気素子
CN104132885B (zh) * 2013-05-02 2016-08-17 中国科学院海洋研究所 一种浪花飞溅区腐蚀电化学行为的研究装置及方法
KR102144334B1 (ko) * 2013-07-24 2020-08-13 삼성전자 주식회사 과산화수소 측정 센서 및 과산화수소 측정 센서의 작업 전극 제조 방법
JP6472664B2 (ja) * 2014-04-14 2019-02-20 日置電機株式会社 測定装置および測定方法
CN105891312B (zh) * 2016-04-07 2018-10-30 广东天承科技有限公司 电镀铜药水的效果评价方法
DE112016007497T5 (de) * 2016-12-28 2019-08-29 Yamamoto-Ms Co., Ltd. Plattiervorrichtung
WO2018163881A1 (ja) * 2017-03-07 2018-09-13 アルプス電気株式会社 生体情報測定用電極及び生体情報測定用電極の製造方法
CN110011617B (zh) * 2019-04-02 2020-07-03 宁夏大学 一种双面太阳能电池超浅结结深的测量方法及其装置
JPWO2020218067A1 (ja) * 2019-04-26 2020-10-29
WO2021142121A1 (en) * 2020-01-07 2021-07-15 The Regents Of The University Of California High-surface area electrodes for wearable electrochemical biosensing
HU231267B1 (hu) * 2020-02-20 2022-07-28 Zoltán Lukács Eljárás és mérési elrendezés acélszerkezetek belső oldali korróziósebességének meghatározására
TW202134646A (zh) * 2020-03-05 2021-09-16 群創光電股份有限公司 溶液感測器
KR20220030577A (ko) * 2020-09-03 2022-03-11 미래나노텍(주) 전자파 차폐 필름
CN115349179A (zh) * 2021-03-12 2022-11-15 株式会社东芝 透明电极及其制造方法、以及使用透明电极的电子器件

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006349387A (ja) * 2005-06-13 2006-12-28 Tdk Corp 金属薄膜の腐食速度解析方法
US20110236769A1 (en) * 2010-03-23 2011-09-29 Xing Xie Three dimensional electrodes useful for microbial fuel cells
JP2016004836A (ja) * 2014-06-13 2016-01-12 日本ゼオン株式会社 色素増感型太陽電池用導電性フィルム、色素増感型太陽電池用電極、色素増感型太陽電池および太陽電池モジュール
WO2016013478A1 (ja) * 2014-07-22 2016-01-28 東洋紡株式会社 薄膜積層フィルム
JP2018514060A (ja) * 2015-04-03 2018-05-31 シー3ナノ・インコーポレイテッドC3Nano Inc. 貴金属被覆銀ナノワイヤー、コーティングを行うための方法および安定化透明導電性フィルム
WO2020054018A1 (ja) * 2018-09-13 2020-03-19 株式会社 東芝 グラフェン含有膜の陰イオン透過性評価方法および光電変換素子
JP2020041982A (ja) * 2018-09-13 2020-03-19 株式会社東芝 膜状構造体の陰イオン透過性評価方法および電気化学素子

Also Published As

Publication number Publication date
CN114303064A (zh) 2022-04-08
JP7198389B2 (ja) 2022-12-28
US20220170871A1 (en) 2022-06-02
WO2022029862A1 (ja) 2022-02-10

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