JPS58112195A - Test system - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method for measuring w by instructions of a sequence processor.
This is about a test system that supplies the knit output to the object to be measured via a switch.

An example of a conventional system is shown in FIG. In the figure, 1 is the sequence processor %2A/2Btll11 constant unit, 3
Person 6B is a switching device, and 4A and 4B are objects to be measured. 1st
Although the figure shows an example in which there are two measurement units 2, two switching devices 6, and two objects to be measured 4, these may be increased or decreased as necessary.

The sequence processor IK has program memo
Combiators, digital circuits, etc. can be used. The measurement unit 2 is provided with, for example, an oscillator and a level meter for AC level measurement, and a power supply, voltage/ammeter, etc. for DC level measurement. Switcher 3 people/5B
is linked to switch between the measurement unit 2/2B and the object to be measured 4A/4B.

Next, an example of the flowchart shown in FIG. 1 is shown in FIG. In the figure, 11 is a measurement item such as AC level measurement, and 12Fi is a measurement item 11 such as DC level measurement.
There are certain items that are different from the above.

The sequence processor 10 commands to measure the measurement item 11 on the object 4A between times t1 and t2. tX,
Measured object 4 for scooping item 12 between time t2 and ts
Measure A. In this case, measurement unit 2 for measurement item 12 is idle while measurement item 11 is being measured, and measurement item 1
2, the measurement unit 2 for measurement item 11 is idle.

During the next time t4 to t6, 1 kJ4B to be measured is measured for measurement items 11 and 12, and the test proceeds in the same manner.

In this way, in the conventional system, there is a measurement unit 2 that is not used during measurement, so there is a problem in that there is a large time loss.

This invention is equipped with registers that individually control the switching of the switching devices 6, and connects each measurement unit 2 to each object to be measured 4 so as not to overlap each other, so that a plurality of objects to be measured 4 can be measured simultaneously. The purpose is to increase the operating rate of the test system.

The present invention will be explained in detail below with reference to one drawing.

First, a configuration diagram of an embodiment according to the present invention is shown in FIG.

FIG. 6 shows a configuration in which registers 5A and 5B are added to the two measurement units 2Brill between the sequence processor 1 and measurement units 2A and 2B in FIG.

The registers SA and 5B are used to recognize which of the objects to be measured 4A and 4B the switches 6A and 6B are connected to, and to test the objects to be measured 4A and 4B. According to the program, switch 3A is installed so that the measurement units 2 and 2B do not collide.
・Control 6B individually and connect to the objects to be measured 4A and 4B.

In FIG. 1, the switchers 3A and 3B are connected to the sequence processor 1.
In contrast, in Fig. 6, the switching device 6A.
3B are individually controlled by registers 5A and 5B.

Next, an example of the flowchart according to FIG. 3 is shown in FIG. 4. In FIG. are playing. On the other hand, in FIG. 4, the object to be measured 4A is measured for measurement item 11 from time t1 to t2, and the object to be measured 4B is measured for measurement item 12 from time t1 to t11. In this case, measurement items 11 and 12
The measuring units 2 used for this purpose are controlled by registers 5A and 5B so that they do not overlap each other.

Further, the object to be measured 4A is measured for measurement item 12 from time t12 to t14, and measurement ring 111 is measured from time 112 to tts for 1 hour.
Measure the object to be measured 4Bt. That is, whereas in FIG. 2, measurements are made in series over time, in FIG. 4, measurements can be made in parallel. this is,
Registers 5A and 5B individually control the switching devices 3A and 3B, and the measuring units 2 and 2B are controlled individually.
This is because L alone is connected to the objects to be measured 4A and 48.

As described above, according to the present invention, the resistor 5 added for controlling the switch 6 is modified and each measurement unit 2 is connected to each object to be measured 4 so as not to overlap, so parallel measurement is possible. It is possible to increase the operating rate of the test system.

[Brief explanation of the drawing]

Figure 1 is an example of a conventional system, and Figure 2 is an example of a flowchart based on Figure 1. Fig. 6 is a configuration diagram of an embodiment according to the present invention. FIG. 4 is an example of a flowchart based on FIG. 3. 1... Sequence processor, 2 people, 2B...
...Measurement equipment), 5A, 5B...Switcher, 4A/4B...Measurement object, 5A/5B...
...Register, 11/12...Measurement items. Agent Patent Attorney Kinji Omata

Claims (1)

[Claims] A switching device that interlocks and switches connections between a sequence processor (1), a plurality of II constants (2J, and each measurement ennin) (2), and a plurality of objects to be measured 4J. (6
), each measurement element) (t-recognizes to which measured object a IIJ cap 21 is selected and connected, and the measurement element) (test of the measured object 4141 selecting 21) Equipped with a register 61 that individually controls the switching of each switch (31) according to the program.
A test system characterized in that it connects to a monster 4 and measures multiple objects to be measured V41 at the same time.