JPH04347531A - Abnormality detector for dc capacitor - Google Patents

Abnormality detector for dc capacitor

Info

Publication number
JPH04347531A
JPH04347531A JP3118501A JP11850191A JPH04347531A JP H04347531 A JPH04347531 A JP H04347531A JP 3118501 A JP3118501 A JP 3118501A JP 11850191 A JP11850191 A JP 11850191A JP H04347531 A JPH04347531 A JP H04347531A
Authority
JP
Japan
Prior art keywords
series
capacitor
connection point
potential
series connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3118501A
Other languages
Japanese (ja)
Inventor
Katsumi Ikeda
勝己 池田
Haruyoshi Mori
治義 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3118501A priority Critical patent/JPH04347531A/en
Publication of JPH04347531A publication Critical patent/JPH04347531A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an abnormality detector for DC capacitor having simplified circuitry wherein the potential of main circuit can be isolated from the control potential. CONSTITUTION:Photocouplers 811c, 812c detect current produced by the potential difference between the series joint (a) of DC capacitors 11a, 12a and the series joint (b) of other DC capacitors 11b, 12b. When the photocouplers 811c, 812c are turned ON, abnormality in the DC capacitors 11a, 12a, 11b, 12b is detected.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明は、直列接続された直流
コンデンサの異常を検出する異常検出器に関するもので
ある。このような直流コンデンサは、例えば半導体素子
を用いて直流を交流に変換する電力変換器の直流フィル
タ回路に使用される。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an abnormality detector for detecting abnormalities in DC capacitors connected in series. Such a DC capacitor is used, for example, in a DC filter circuit of a power converter that converts DC to AC using a semiconductor element.

【0002】0002

【従来の技術】図4は例えば特開昭62−250875
号公報に示された直流コンデンサの異常検出器の回路で
あり、図において、11a,12a及び11b,12b
は夫々直列接続された直流コンデンサ、13a,14a
は直流コンデンサ11a,12aの分圧を均一化する分
圧抵抗、13b,14bは同じく直流コンデンサ11b
,12bの分圧を均一化する分圧抵抗、15は前記直流
コンデンサ11a,12aの直列接続点aと直流コンデ
ンサ11b,12bの直列接続点bとの電位差を比較す
る比較回路、16は比較回路15の主要素としての差動
増幅器、17a,17bは差動増幅器16の入力抵抗、
18は差動増幅器16のフィードバック抵抗、19は差
動増幅器16の出力と予め設定された基準電位を越えた
か否かを検出するウィンドコンパレータであり、前記比
較回路15とウィンドコンパレータ19とで比較手段2
0が構成されている。
[Prior Art] FIG. 4 shows, for example, Japanese Patent Application Laid-Open No. 62-250875
This is a circuit of a DC capacitor abnormality detector shown in the publication, and in the figure, 11a, 12a and 11b, 12b
are DC capacitors 13a and 14a connected in series, respectively.
is a voltage dividing resistor that equalizes the partial voltage of DC capacitors 11a and 12a, and 13b and 14b are also DC capacitors 11b.
, 12b, 15 is a comparison circuit that compares the potential difference between the series connection point a of the DC capacitors 11a and 12a and the series connection point b of the DC capacitors 11b and 12b, and 16 is a comparison circuit. 15 is a differential amplifier as a main element, 17a and 17b are input resistances of the differential amplifier 16,
18 is a feedback resistor of the differential amplifier 16; 19 is a window comparator that detects whether the output of the differential amplifier 16 exceeds a preset reference potential; the comparison circuit 15 and the window comparator 19 form a comparison means 2
0 is configured.

【0003】次に動作について説明する。図4のように
構成された直流コンデンサの異常検出器においては、直
流コンデンサが正常である場合には、直流コンデンサ1
1a,11bの直列接続点aと、直流コンデンサ11b
,12bの直列接続点bとの電位差は数V以下である。 ここで、例えば直流コンデンサ11aが短絡したとする
と、両接続点a,bの電位Va,Vbの差、すなわちV
a−Vbは、回路の電圧VE/2となり、差動増幅器1
6の出力にはこれに見合う電圧が発生してウィンドコン
パレータ19により直流コンデンサに異常が発生したこ
とを検出することができる。
Next, the operation will be explained. In the DC capacitor abnormality detector configured as shown in Fig. 4, when the DC capacitor is normal, the DC capacitor 1
Series connection point a of 1a and 11b and DC capacitor 11b
, 12b and the series connection point b is several volts or less. For example, if the DC capacitor 11a is short-circuited, the difference between the potentials Va and Vb at the connection points a and b, that is, V
a-Vb becomes the voltage VE/2 of the circuit, and the differential amplifier 1
A corresponding voltage is generated at the output of 6, and the window comparator 19 can detect that an abnormality has occurred in the DC capacitor.

【0004】また、直流コンデンサ11a,12a及び
11b,12bのどれかに、経時的使用によりその容量
に大きな変化が発生したり、漏れ電流が大きくなった場
合にも、Va−Vbの電位差が増大するために、差動増
幅器16に電位が発生して出力されるので、直流コンデ
ンサのどれかに異常が発生したことを検出することがで
きる。
[0004] Furthermore, if any of the DC capacitors 11a, 12a and 11b, 12b undergoes a large change in its capacitance due to use over time, or if the leakage current increases, the potential difference between Va and Vb will increase. In order to do this, a potential is generated in the differential amplifier 16 and output, so that it is possible to detect that an abnormality has occurred in any of the DC capacitors.

【0005】[0005]

【発明が解決しようとする課題】従来の直流コンデンサ
の異常検出器は、以上のように構成されているので、検
出回路が複雑で、また主回路電位と制御電位とを絶縁す
る場合には、検出部に絶縁アンプを必要とするため、高
価になるという問題点があった。
[Problems to be Solved by the Invention] Conventional DC capacitor abnormality detectors are constructed as described above, so the detection circuit is complicated, and when the main circuit potential and control potential are insulated, Since the detection section requires an isolated amplifier, there is a problem in that it is expensive.

【0006】この発明は上記のような問題点を解消する
ためになされたもので、検出部の回路構成をより簡略化
し、かつ、主回路電位と制御電位とも絶縁できる直流コ
ンデンサの異常検出器を得ることを目的とする。
The present invention has been made to solve the above-mentioned problems, and provides a DC capacitor abnormality detector that can further simplify the circuit configuration of the detection section and is also insulated from the main circuit potential and the control potential. The purpose is to obtain.

【0007】[0007]

【課題を解決するための手段】この発明に係わる直流コ
ンデンサの異常検出器は、ある直流コンデンサの直列接
続点と、別の直流コンデンサの直列接続点との電位差で
流れる電流を検出するフォトカプラを設けたものである
[Means for Solving the Problems] A DC capacitor abnormality detector according to the present invention uses a photocoupler that detects a current flowing due to a potential difference between a series connection point of one DC capacitor and a series connection point of another DC capacitor. It was established.

【0008】[0008]

【作用】この発明における直流コンデンサの異常検出器
は、フォトカプラがONすることにより異常を検出する
[Operation] The DC capacitor abnormality detector according to the present invention detects an abnormality when a photocoupler is turned on.

【0009】[0009]

【実施例】実施例1.図1に本発明の一実施例を示す。 前述の図4と対応する機能については同じ番号をつけて
いる。810 番台は、フォトカプラであり、添え字の
cは、フォトカプラの発光側、添え字dは、フォトカプ
ラの受光側を示す。801 は、前記フォトカプラの発
光側つまり第1及び第2の発光素子811c, 812
cの入力電流の制限抵抗、802 はフォトカプラの受
光側811d, 812dのプルアップ抵抗、851 
は制御電源、841 はフォトカプラ811, 812
の出力を並列接続によりワイヤードORした信号により
直流コンデンサの異常による故障処理を行う故障処理回
路である。
[Example] Example 1. FIG. 1 shows an embodiment of the present invention. Functions corresponding to those in FIG. 4 described above are given the same numbers. Numbers in the 810 series are photocouplers; the subscript c indicates the light emitting side of the photocoupler, and the subscript d indicates the light receiving side of the photocoupler. 801 is the light emitting side of the photocoupler, that is, the first and second light emitting elements 811c, 812
c is the input current limiting resistor, 802 is the pull-up resistor of the photocoupler light receiving side 811d, 812d, 851
is the control power supply, 841 is the photo coupler 811, 812
This is a failure processing circuit that processes failures due to abnormalities in DC capacitors using a wired-OR signal obtained by connecting the outputs of the two in parallel.

【0010】次に、上記実施例の動作を図1を参照しな
がら説明する。直流コンデンサが異常の時、直列接続点
a,bの間に電位差が発生するのは、従来例と同じであ
る。例えば、直流コンデンサ11bが何らかの異常で短
絡したとすると、接続点bの電位が上昇していき、上記
各接続点の電位差と抵抗801 で決定する電流がフォ
トカプラの発光側812c(第2の発光素子)に流れる
。電位差が大きくなりフォトカプラ812cに流れる電
流がある値以上になると、受光側812dの出力である
トランジスタがONしフォトカプラ812c(第2の発
光素子)の出力はロウレベルとなる。次に、直流コンデ
ンサ12bが何らかの異常で短絡したとき、接続点bの
電位が下降していき、上記各接続点の電位差と抵抗80
1 で決定する電流がフォトカプラの発光側811c(
第1の発光素子)に流れる。電位差が大きくなりフォト
カプラ811c(第1の発光素子)に流れる電流がある
値以上になると、受光側811dの出力であるトランジ
スタがONしフォトカプラ811 の出力はロウレベル
となる。この時フォトカプラ811 と812 の出力
を、並列接続しワイヤードORをとり直流コンデンサの
異常検出信号として、故障処理回路に与える。
Next, the operation of the above embodiment will be explained with reference to FIG. As in the conventional example, when the DC capacitor is abnormal, a potential difference is generated between the series connection points a and b. For example, if the DC capacitor 11b is short-circuited due to some abnormality, the potential at the connection point b will rise, and the current determined by the potential difference between the connection points and the resistor 801 will flow to the light-emitting side 812c (second light-emitting side) of the photocoupler. element). When the potential difference increases and the current flowing through the photocoupler 812c exceeds a certain value, the transistor that is the output of the light receiving side 812d turns on, and the output of the photocoupler 812c (second light emitting element) becomes low level. Next, when the DC capacitor 12b is short-circuited due to some abnormality, the potential at the connection point b decreases, and the potential difference between the above connection points and the resistance 80
The current determined by 1 is the light emitting side 811c of the photocoupler (
(first light emitting element). When the potential difference increases and the current flowing through the photocoupler 811c (first light emitting element) exceeds a certain value, the transistor that is the output of the light receiving side 811d turns on and the output of the photocoupler 811 becomes low level. At this time, the outputs of the photocouplers 811 and 812 are connected in parallel, wired ORed, and applied to the failure processing circuit as a DC capacitor abnormality detection signal.

【0011】実施例2.また、上記実施例では、異常が
発生する直流コンデンサにより電流の流れる方向がちが
うため、フォトカプラが2ついる。そこで、図2のよう
に検出部をダイオードD821−D824 によりフル
ブリジ接続して全波整流回路820 を構成することに
より電流の方向に関係なく、1つの発光素子811cか
らなるフォトカプラで同様な効果が期待できる。
Example 2. Furthermore, in the above embodiment, two photocouplers are required because the direction of current flow differs depending on the DC capacitor in which the abnormality occurs. Therefore, as shown in FIG. 2, by configuring a full-wave rectifier circuit 820 by connecting the detection section with diodes D821-D824 in a full bridge, a photocoupler consisting of one light emitting element 811c can achieve the same effect regardless of the direction of the current. You can expect it.

【0012】実施例3.図1の実施例においては、回路
の動作試験をするとき、直流コンデンサを短絡しなけれ
ば動作を確認することができない。そこで図3のように
ダイオードD821 トフォトカプラの第1の発光素子
811acとの直列回路と、ダイオードD822 をフ
ォトカプラの受光側つまり第2の発光素子812cとの
直列回路とを直列接続点a,b間に挿入し端子831,
 832をVEP,VENに接続する事によりにより簡
単に動作確認することができる。例えば、端子831 
を直流電圧の正側であるVEPに接続することによって
フォトカプラの発光側811cに電流がながれるので、
直流コンデンサの異常検出の模擬動作を実施できる。
Example 3. In the embodiment shown in FIG. 1, when testing the operation of the circuit, the operation cannot be confirmed unless the DC capacitor is shorted. Therefore, as shown in FIG. 3, a series connection point a, a series circuit between the diode D821 and the first light emitting element 811ac of the photocoupler, and a series circuit between the diode D822 and the light receiving side of the photocoupler, that is, the second light emitting element 812c, are connected. Insert terminal 831 between
By connecting 832 to VEP and VEN, operation can be more easily confirmed. For example, terminal 831
By connecting VEP to the positive side of the DC voltage, a current flows to the light emitting side 811c of the photocoupler.
It is possible to simulate the abnormality detection of DC capacitors.

【0013】[0013]

【発明の効果】以上のように、この発明によれば、検出
部をフォトカプラで構成することにより回路が簡略化で
き、かつ、主回路電位と制御電位とを絶縁できる直流コ
ンデンサの異常検出が構成できるという効果がある。
[Effects of the Invention] As described above, according to the present invention, the circuit can be simplified by configuring the detection section with a photocoupler, and abnormality detection of a DC capacitor that can isolate the main circuit potential and the control potential is possible. It has the effect of being configurable.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】この発明の実施例1による直流コンデンサの異
常検出器の回路図である。
FIG. 1 is a circuit diagram of a DC capacitor abnormality detector according to a first embodiment of the present invention.

【図2】この発明の実施例2による直流コンデンサの異
常検出器の回路図である。
FIG. 2 is a circuit diagram of a DC capacitor abnormality detector according to a second embodiment of the present invention.

【図3】この発明の実施例3による直流コンデンサの異
常検出器の回路図である。
FIG. 3 is a circuit diagram of a DC capacitor abnormality detector according to a third embodiment of the present invention.

【図4】従来の直流コンデンサの異常検出器の回路図で
ある。
FIG. 4 is a circuit diagram of a conventional DC capacitor abnormality detector.

【符号の説明】[Explanation of symbols]

11a 直流コンデンサ 11b 直流コンデンサ 12a 直流コンデンサ 12b 直流コンデンサ 811c  第1の発光素子 812c  第2の発光素子 820 全波整流回路 821 ダイオード 822 ダイオード a  直列接続点 b  直列接続点 11a DC capacitor 11b DC capacitor 12a DC capacitor 12b DC capacitor 811c First light emitting element 812c Second light emitting element 820 Full wave rectifier circuit 821 diode 822 diode a Series connection point b Series connection point

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】  直流コンデンサを複数個直列接続した
直列回路を並列に複数接続した直流コンデンサ回路の異
常を検出する異常検出器において、前記直列回路のうち
の一の直列回路の直列接続点と、他の直列回路の直列接
続点との間に、一方の直列接続点の電位が他方の直列接
続点の電位より高い場合に動作する第1の発光素子及び
他方の直列接続点の電位が一方の直列接続点の電位より
高い場合に動作する第2の発光素子を接続したことを特
徴とする直流コンデンサの異常検出器。
1. An abnormality detector for detecting an abnormality in a DC capacitor circuit in which a plurality of series circuits each having a plurality of DC capacitors connected in series are connected in parallel, the series connection point of one of the series circuits; A first light emitting element that operates when the potential of one series connection point is higher than the potential of the other series connection point and the potential of the other series connection point of the other series connection point are connected to one of the series connection points of the other series circuit. An abnormality detector for a DC capacitor, characterized in that a second light emitting element is connected which operates when the potential is higher than the potential of a series connection point.
【請求項2】  直流コンデンサを複数個直列接続した
直列回路を並列に複数接続した直流コンデンサ回路の異
常を検出する異常検出器において、前記直列回路のうち
の一の直列回路の直列接続点と、他の直列回路の直列接
続点との間に全波整流回路及びこの全波整流回路の何れ
かのアームに電流が流れると動作する発光素子とを接続
したことを特徴とする直流コンデンサの異常検出器。
2. An abnormality detector for detecting an abnormality in a DC capacitor circuit in which a plurality of series circuits each having a plurality of DC capacitors connected in series are connected in parallel, the series connection point of one of the series circuits; Abnormality detection in a DC capacitor, characterized in that a full-wave rectifier circuit and a light emitting element that operates when current flows through any arm of the full-wave rectifier circuit are connected between a series connection point of another series circuit. vessel.
【請求項3】  直流コンデンサを複数個直列接続した
直列回路を並列に複数接続した直流コンデンサ回路の異
常を検出する異常検出器において、前記直列回路のうち
の一の直列回路の直列接続点と、他の直列回路の直列接
続点との間に、一方の直列接続点の電位が他方の直列接
続点の電位より高い場合に動作する発光素子とダイオー
ドとの第1の直列回路及び他方の電位が一方の直列接続
点の電位より高い場合に動作する発光素子とダイオード
との第2の直列回路を接続したことを特徴とする直流コ
ンデンサの異常検出器。
3. An abnormality detector for detecting an abnormality in a DC capacitor circuit in which a plurality of series circuits each having a plurality of DC capacitors connected in series are connected in parallel, wherein a series connection point of one of the series circuits; A first series circuit of a light emitting element and a diode, which operates when the potential of one series connection point is higher than the potential of the other series connection point, and the other series connection point are connected to the series connection point of the other series circuit. An abnormality detector for a DC capacitor, characterized in that a second series circuit of a light emitting element and a diode is connected, which operates when the potential is higher than the potential of one series connection point.
JP3118501A 1991-05-23 1991-05-23 Abnormality detector for dc capacitor Pending JPH04347531A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3118501A JPH04347531A (en) 1991-05-23 1991-05-23 Abnormality detector for dc capacitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3118501A JPH04347531A (en) 1991-05-23 1991-05-23 Abnormality detector for dc capacitor

Publications (1)

Publication Number Publication Date
JPH04347531A true JPH04347531A (en) 1992-12-02

Family

ID=14738235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3118501A Pending JPH04347531A (en) 1991-05-23 1991-05-23 Abnormality detector for dc capacitor

Country Status (1)

Country Link
JP (1) JPH04347531A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012090506A (en) * 2010-10-22 2012-05-10 Toshiba Mitsubishi-Electric Industrial System Corp Power conversion device
GB2521683A (en) * 2013-12-19 2015-07-01 Control Tech Ltd Capacitor failure

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5546830A (en) * 1978-09-29 1980-04-02 Tokyo Shibaura Electric Co Condenser protecting device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5546830A (en) * 1978-09-29 1980-04-02 Tokyo Shibaura Electric Co Condenser protecting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012090506A (en) * 2010-10-22 2012-05-10 Toshiba Mitsubishi-Electric Industrial System Corp Power conversion device
GB2521683A (en) * 2013-12-19 2015-07-01 Control Tech Ltd Capacitor failure
GB2521683B (en) * 2013-12-19 2016-04-20 Control Tech Ltd Capacitor failure

Similar Documents

Publication Publication Date Title
JPS62250875A (en) Abnormal state detector for dc condenser
US9030853B2 (en) Power conversion equipment having a capacitor failure detecting circuit
US10794938B2 (en) Voltage detecting circuit
JPH05107292A (en) Disconnection detector
JPH04347531A (en) Abnormality detector for dc capacitor
US11408921B2 (en) Circuit and method for realizing a combined connection of neutral wires or live wires using phase information of the neutral wires and the live wires
WO2018092475A1 (en) Wiring line abnormality detecting device
JPS61139220A (en) Phase missing detection circuit for 3-phase altering current
US5768342A (en) Telephone system loop current detector
JPH04238272A (en) Power supply circuit with leakage current detecting function
JPS646612B2 (en)
JP3074201B2 (en) Abnormality detection circuit for solid state contactor
JP2000180491A (en) Open-phase detection circuit
JPH0431613Y2 (en)
ITMI991472A1 (en) CIRCUIT PROVISION TO CHECK A RECOGNITION CIRCUIT
JP2001034348A (en) Analog signal output device
JP2005102443A (en) Output voltage detecting method of power converter
JPS58218658A (en) Current detecting circuit
KR900007797Y1 (en) Abnomal state detector for dc condenser
JPS62147950A (en) Detection circuit for failure of element
SU1275636A1 (en) Rectifier unit of semiconductor converter
JPS62136921A (en) And output circuit
JPS5864517A (en) Control circuit device
JPS5843175A (en) Defect detector for thyristor
JPH04260998A (en) Security unit